Additive manufacturing in the realm of 3D printing has transformed the manufacturing sector,
providing unmatched freedom in design and rapid prototyping abilities. However, a …

The number of memory faults operating in radiation environments increases with the
electronic device miniaturization. One-dimensional (1D) Error Correction Codes (ECCs) are …

The evolution of microelectronics boosts more scalable and complex circuit designs,
providing high processing speed and greater storage capacity. However, reliability issues …

Advances in integrated circuit production technologies have reduced device sizes, leading
to corresponding scaling in electrical characteristics, such as threshold voltage. This scaling …

Finite State Machine (FSM) is widely used in electronic systems and its reliability is critical to
the system. Ionizing radiation induced soft error is one of the major concerns in the design of …

The diversity of nanosatellite applications is increasingly attracting the scientific community's
attention. The main component of these satellites is the OnBoard Computer (OBC), which is …

Memory errors can cause crashes and data loss, which are unacceptable for various
computing systems, mainly large servers. Memory controllers can mitigate these errors by …

Memories play a very important role in computing systems due to the continuous
advancements in technology. They are used to store data that is used for proper system …

Soft errors caused by external radiation sources have historically affected the reliability of
electronic devices. The radiation effects community has dedicated significant effort to …

The increasing vulnerability of memory devices to errors due to smaller transistor sizes,
larger densities, and lower operating voltages raises the demand for efficient Error …