Structure and properties of Sn-Cu lead-free solders in electronics packaging

M Zhao, L Zhang, ZQ Liu, MY Xiong… - Science and technology …, 2019 - Taylor & Francis
With the development of lead-free solders in electronic packaging, Sn-Cu lead-free solder
has attracted wide attention due to its excellent comprehensive performance and low cost. In …

Critical properties of Cu6Sn5 in electronic devices: Recent progress and a review

DK Mu, SD McDonald, J Read, H Huang… - Current Opinion in Solid …, 2016 - Elsevier
As the most common of the intermetallic compounds (IMCs) formed between Sn-based
solders and Cu substrates during the packaging of integrated circuits (ICs), Cu 6 Sn 5 is …

Influence of Indium addition on microstructural and mechanical behavior of Sn solder alloys: Experiments and first principles calculations

A Luktuke, ASS Singaravelu, A Mannodi-Kanakkithodi… - Acta Materialia, 2023 - Elsevier
The composition of alloying elements in Sn-rich solder plays a pivotal role in determining the
performance of solder joints in an electronic package. Recently, Indium (In) has attracted …

The influence of Ni and Zn additions on microstructure and phase transformations in Sn–0.7 Cu/Cu solder joints

G Zeng, SD McDonald, Q Gu, Y Terada, K Uesugi… - Acta Materialia, 2015 - Elsevier
Microalloying, in which the solidification structure is preferably and significantly modified by
trace elements, is a key method for improving Pb-free interconnections in electronic devices …

Effect of Ni doping on elastic properties, fracture toughness, electronic properties, and thermal conductivity of η'-Cu6Sn5 in Sn-Cu solder: A first-principles calculation

S Xu, A Yang, Y Duan, M Li, M Peng - Materials Today Communications, 2023 - Elsevier
The phase stability, elastic properties, fracture toughness, electronic structure and thermal
conductivity of Ni-doped η'-Cu 6 Sn 5 have been obtained using first-principles calculations …

Anisotropic thermal expansion of Ni3Sn4, Ag3Sn, Cu3Sn, Cu6Sn5 and βSn

JW Xian, G Zeng, SA Belyakov, Q Gu, K Nogita… - Intermetallics, 2017 - Elsevier
The directional coefficient of thermal expansion (CTE) of intermetallics in electronic
interconnections is a key thermophysical property that is required for microstructure-level …

The effect of indium microalloying on lead-free solders: a review

B Li, S Liu, Y Sun, G Sun, S Qu, P He… - Materials Science in …, 2025 - Elsevier
The restriction of using toxic and harmful Sn-Pb solders has led to the rapid development of
lead-free solders in recent decades. This research on the effect of indium (In) microalloying …

Kinetics of the polymorphic phase transformation of Cu6Sn5

G Zeng, SD McDonald, JJ Read, Q Gu, K Nogita - Acta materialia, 2014 - Elsevier
Cu 6 Sn 5 is a critical intermetallic compound in soldering and three-dimensional integrated
circuit packaging technology and exists in at least five different crystal structures in the solid …

[HTML][HTML] Microstructural and mechanical characterization of Cu/Sn SLID bonding utilizing Co as contact metallization layer

F Emadi, V Vuorinen, S Mertin, K Widell… - Journal of Alloys and …, 2022 - Elsevier
Most micro-electro-mechanical systems (MEMS) devices contain fragile moving parts, which
poses challenges in process integration of interconnection methods requiring wet-chemistry …

Electronic and mechanical properties of η-Cu6Sn5 doped by Ni: A first-principles study

J Sheng, J Zhao, B Wang, J Yan - Materials Today Communications, 2024 - Elsevier
In this paper, based on the crystallographic characteristics of η-Cu 6 Sn 5, a 1× 1× 5
supercell was constructed, and Ni atom was doped into each of the eight Cu2 sites …