VB Neimash, AO Goushcha… - Ukrainian journal of …, 2014 - ujp.bitp.kiev.ua
Formation of Si nanocrystals in amorphous Si-metallic Sn film structures has been studied experimentally, by using the Auger spectroscopy, electron microscopy, and Raman …
VB Neimash, VM Poroshin… - Semiconductor …, 2013 - irbis-nbuv.gov.ua
The influence of tin impurity on amorphous silicon crystallization was investigated using the methods of Raman scattering, Auger spectroscopy at ion etching, scanning electron …
V Neimash - Chapt. 15 in nanostructured semiconductors …, 2017 - taylorfrancis.com
Thin films of nanocrystalline silicon (nc-Si) are considered among the most attractive materials for the third-and next generations of solar cells and other optoelectronic devices …
Методами оже-спектроскопiї, електронної мiкроскопiї та комбiнацiйного розсiювання свiтла експериментально дослiджено формування нанокристалiв Si в плiвкових …