R Lorenzo, SNS Vajhala… - 2022 2nd International …, 2022 - ieeexplore.ieee.org
Memory is an essential element of every VLSI circuit. This paper reviews Content Addressable Memory (CAM) and its conventional architectures. A model of CAM is proposed …
Motivated by the necessity to consider probabilistic approaches to future designs, the main objective of this thesis was to develop and characterize energy efficient probabilistic CMOS …
SC Goldstein - … -2005. IEEE/ACM International Conference on …, 2005 - ieeexplore.ieee.org
Nanoscale technologies provide both challenges and opportunities. We show that the issues and potential solutions facing designers are technology independent and arise …
AD Es-Sakhi, MH Chowdhury - Microelectronics Journal, 2015 - Elsevier
This paper presents the concept of a new field effect transistor based on ferroelectric insulator. The proposed design is named Partially Depleted Silicon-on-Ferroelectric …
DK Das, BB Bhattacharya - … of the Fourth Asian Test Symposium, 1995 - ieeexplore.ieee.org
Design of irredundant and fully testable non-scan synchronous sequential circuits is a major concern of logic synthesis. The presence of sequentially redundant faults (SRFs) makes test …
AD Es-Sakhi, MH Chowdhury - Materials Science in Semiconductor …, 2015 - Elsevier
This paper presents the concept of a new field effect transistor (FET) named a Partially Depleted Silicon-on-Ferroelectric Insulator Field Effect Transistor (PD-SOFFET). Our design …
J Yu, P Beckett - Proceedings of the 24th edition of the great lakes …, 2014 - dl.acm.org
Both asynchronous and reconfigurable techniques are likely to become increasingly important in the future due to greater device unreliability and variability at nano-scale …
Током протеклих деценија усавршавање технолошког процеса производње CMOS интегрисаних кола незадрживо се одвијало. Према чувеном Муровом закону, темпо …