We present a comprehensive review of the material properties of cadmium zinc telluride
(CZT, Cd1− xZnxTe) with zinc content x= 0.1–0.2. Particular emphasis is placed on those …

A review of recent applications of Raman spectroscopy as a fast, sensitive, and non-
destructive technique for exploring II–VI semiconductor nanocrystals fabricated by various …

The relativistic band structure and band-gap bowing factors of ternary II-VI semiconductor
alloys containing Cd, Zn, Se and Te are calculated by the ab initio self-consistent …

The Raman-scattering spectra of I-III-VI 2 group chalcopyrite semiconductors and their solid
solutions were measured. The frequency relationship for the A 1 vibrational mode agrees …

Abstract Polycrystalline Cd 1-x Zn x Te thin films prepared by a combinatorial MOCVD
process were characterised for their structural, optical, and electrical properties. Films …

Abstract Thick polycrystalline Cd 1-x Zn x Te films with different Zn concentration were
deposited by the close-spaced vacuum sublimation method on ITO-coated glass substrates …

The polycrystalline CdZnTe films are promising material for fabrication of X-ray detection
and solar cells. In this study, a pebble-like grain, hexagonal grain and worm-like grain of …

This paper reports the results of structural, photoluminescence and Raman characterization
of thick Cd 1− x Zn x Te films with different zinc concentration obtained by the close spaced …

Nanocrystalline ZnTe was prepared by mechanical alloying. X-ray diffraction (XRD), energy
dispersive spectroscopy, Raman spectroscopy, and photoacoustic absorption spectroscopy …

Polycrystalline thin films of Cd 1-x Zn x Te on glass were grown by pulsed laser deposition
using an XeCl excimer laser. X-ray diffraction, optical absorption, Raman scattering and …