In this Article, I review the development of computer simulation techniques for studying
radiation effects in materials from 1946 until 2018. These developments were often closely …

Secondary ion mass spectrometry, SIMS, is the mass spectrometry of ionised particles which
are emitted when a surface is bombarded by energetic primary particles, usually ions (for …

Surface metallization by plasma coating enhances desorption/ionization of membrane
components such as lipids and sterols in imaging time-of-flight secondary ion mass …

Molecular dynamics simulations are used to investigate the separation of water films
adjacent to a hot metal surface. The simulations clearly show that the water layers nearest …

Hydrocarbon oligomers, high-molecular-weight polymers, and polymer additives have been
covered with 2− 60 nmol of gold/cm2 in order to enhance the ionization efficiency for static …

Ion and electron irradiation can be used to modify not only conventional materials such as
silicon, but also nanostructures. This opens up exciting possibilities for basic science studies …

A study is presented of the factors affecting the calibration of the mass scale in time-of-flight
secondary ion mass spectrometry (TOF-SIMS). At the present time, TOF-SIMS analysts using …

Significant events driving the development of SIMS over the last 50 years are reviewed. The
discussion includes recollections of dynamic and static SIMS from the 1970s, of the …

Energy and angular distributions of sputtered species from a wide variety of target materials
(metals, semiconductors, alkali halides, frozen gases, and organic solids) are discussed …

The metallization procedure, proposed recently for signal improvement in organic secondary
ion mass spectrometry (SIMS)(Delcorte, A.; Médard, N.; Bertrand, P. Anal. Chem. 2002, 74 …