For more than 25 years, the Physikalisch‐Technische Bundesanstalt has been strongly
engaged in the field of metrology using synchrotron radiation. In Berlin, this research …

Abstract FeNi Hydroxides (FeNi-HD) have been considered as promising substitutes to
noble metal electrocatalysts for oxygen evolution reaction (OER). In this work, we design …

X-ray spectrometry is a wide spread technique for revealing reliable information concerning
the elemental composition and binding state in various materials. Reference-free …

Total reflection X-ray fluorescence (TXRF) analysis is a well-established method to monitor
lowest level contamination on semiconductor surfaces. Even light elements on a wafer …

A novel ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related
techniques for nanoanalytics by means of synchrotron radiation has been constructed and …

Mask aligner lithography, based on shadow printing, is one of the most natural approaches
to micro-fabrication. For high-yield processing, however, contact-free proximity exposures …

Organosilanes are used routinely to functionalize various support materials for further
modifications. Nevertheless, reliable quantitative information about surface functional group …

The development of EUV lithography, has made high-accuracy at-wavelength metrology
necessary. Radiometry using synchrotron radiation has been performed by the German …

Abstract Knowledge on the temporal and size distribution of particulate matter (PM) in air as
well as on its elemental composition is a key information for source appointment, for the …

With the help of adapted off-axis reflection zone plates, near edge X-ray absorption fine
structure spectra at the C and N K-absorption edge have been recorded using a single 1.2 …