Review of silicon carbide processing for power MOSFET

C Langpoklakpam, AC Liu, KH Chu, LH Hsu, WC Lee… - Crystals, 2022 - mdpi.com
Owing to the superior properties of silicon carbide (SiC), such as higher breakdown voltage,
higher thermal conductivity, higher operating frequency, higher operating temperature, and …

Overview of real-time lifetime prediction and extension for SiC power converters

Z Ni, X Lyu, OP Yadav, BN Singh… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Remaining useful lifetime prediction and extension of Si power devices have been studied
extensively. Silicon carbide (SiC) power devices have been developed and commercialized …

Reliability of wide band gap power electronic semiconductor and packaging: A review

Y Wang, Y Ding, Y Yin - Energies, 2022 - mdpi.com
Wide band gap (WBG) power electronic devices, such as silicon carbide metal–oxide–
semiconductor field-effect transistors (SiC MOSFETs) and gallium–nitride high-electron …

Design and performance evaluation of overcurrent protection schemes for silicon carbide (SiC) power MOSFETs

Z Wang, X Shi, Y Xue, LM Tolbert… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
Overcurrent protection of silicon carbide (SiC) metal–oxide–semiconductor field-effect
transistors (MOSFETs) remains a challenge due to lack of practical knowledge. This paper …

Gate oxide reliability issues of SiC MOSFETs under short-circuit operation

TT Nguyen, A Ahmed, TV Thang… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
Silicon-Carbide (SiC) MOSFETs, due to material properties, are designed with smaller
thickness in the gate oxide and a higher electric field compared to Si MOSFETs …

Short-circuit protection circuits for silicon-carbide power transistors

DP Sadik, J Colmenares, G Tolstoy… - IEEE transactions on …, 2015 - ieeexplore.ieee.org
An experimental analysis of the behavior under short-circuit conditions of three different
silicon-carbide (SiC) 1200-V power devices is presented. It is found that all devices take up …

Reliability issues of SiC MOSFETs: A technology for high-temperature environments

CY Liangchun, GT Dunne, KS Matocha… - … on Device and …, 2010 - ieeexplore.ieee.org
The wide-bandgap nature of silicon carbide (SiC) makes it an excellent candidate for
applications where high temperature is required. The metal-oxide-semiconductor (MOS) …

Density of interface states, electron traps, and hole traps as a function of the nitrogen density in SiO2 on SiC

J Rozen, S Dhar, ME Zvanut, JR Williams… - Journal of Applied …, 2009 - pubs.aip.org
Nitridation of the SiO 2/SiC interface yields a reduction in interface state density, immunity to
electron injection, as well as increased hole trapping. It is shown that the accumulation of …

Real-time aging detection of SiC MOSFETs

F Erturk, E Ugur, J Olson, B Akin - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
This paper presents a comprehensive study on degradation monitoring of silicon carbide
mosfets and proposes an early warning method to detect aging. The proposed plug-in tool …

Integrated digital and analog circuit blocks in a scalable silicon carbide CMOS technology

J Romijn, S Vollebregt, LM Middelburg… - … on Electron Devices, 2021 - ieeexplore.ieee.org
The wide bandgap of silicon carbide (SiC) has attracted a large interest over the past years
in many research fields, such as power electronics, high operation temperature circuits …