Remaining useful lifetime prediction and extension of Si power devices have been studied extensively. Silicon carbide (SiC) power devices have been developed and commercialized …
Wide band gap (WBG) power electronic devices, such as silicon carbide metal–oxide– semiconductor field-effect transistors (SiC MOSFETs) and gallium–nitride high-electron …
Z Wang, X Shi, Y Xue, LM Tolbert… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
Overcurrent protection of silicon carbide (SiC) metal–oxide–semiconductor field-effect transistors (MOSFETs) remains a challenge due to lack of practical knowledge. This paper …
TT Nguyen, A Ahmed, TV Thang… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
Silicon-Carbide (SiC) MOSFETs, due to material properties, are designed with smaller thickness in the gate oxide and a higher electric field compared to Si MOSFETs …
An experimental analysis of the behavior under short-circuit conditions of three different silicon-carbide (SiC) 1200-V power devices is presented. It is found that all devices take up …
CY Liangchun, GT Dunne, KS Matocha… - … on Device and …, 2010 - ieeexplore.ieee.org
The wide-bandgap nature of silicon carbide (SiC) makes it an excellent candidate for applications where high temperature is required. The metal-oxide-semiconductor (MOS) …
Nitridation of the SiO 2/SiC interface yields a reduction in interface state density, immunity to electron injection, as well as increased hole trapping. It is shown that the accumulation of …
F Erturk, E Ugur, J Olson, B Akin - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
This paper presents a comprehensive study on degradation monitoring of silicon carbide mosfets and proposes an early warning method to detect aging. The proposed plug-in tool …
The wide bandgap of silicon carbide (SiC) has attracted a large interest over the past years in many research fields, such as power electronics, high operation temperature circuits …