[图书][B] Radiation effects in advanced semiconductor materials and devices

C Claeys, E Simoen - 2013 - books.google.com
In the modern semiconductor industry, there is a growing need to understand and combat
potential radiation damage problems. Space applications are an obvious case, but, beyond …

Ionizing radiation defects and reliability of Gallium Nitride-based III-V semiconductor devices: a comprehensive review

V Sandeep, JC Pravin, SA Kumar - Microelectronics Reliability, 2024 - Elsevier
The remote sensing and satellite community working for space organizations have
expressed interest in building advanced devices with potential choices for Gallium Nitride …

[图书][B] Reliability and radiation effects in compound semiconductors

AH Johnston - 2010 - books.google.com
This book focuses on reliability and radiation effects in compound semiconductors, which
have evolved rapidly during the last 15 years. It starts with first principles, and shows how …

Proton Irradiation Effects on Dual Delta-Doped AlGaAs/InGaAs/AlGaAs Pseudomorphic High Electron Mobility Transistors

S Hou, S Dong, J Yang, Z Liu, E Guan… - … on Nuclear Science, 2024 - ieeexplore.ieee.org
In this article, we mainly studied the proton irradiation effects on novel dual delta-doping
GaAs-based pseudomorphic high-electron-mobility transistors (PHEMTs). The conventional …

Neutron radiation effects in high electron mobility transistors [AlGaAs/GaAs]

M Papastamatiou, N Arpatzanis… - … on Electron Devices, 2002 - ieeexplore.ieee.org
The effect of fast neutron radiation has been investigated in High Electron Mobility
Transistors (HEMT's). Devices with different layer structures have been employed for the …

Characteristics of GaAs complementary heterojunction FETs (C-HFETs) and C-HFET based amplifiers exposed to high neutron fluences

W Karpinski, K Lübelsmeyer, D Pandoulas… - Nuclear Instruments and …, 1995 - Elsevier
This paper discusses the electrical properties of complementary GaAs heterojunction FETs
and of amplifiers based on these devices before and after irradiation with neutrons for a total …

GaAs based field effect transistors for radiation-hard applications

C Claeys, E Simoen, C Claeys, E Simoen - Radiation effects in advanced …, 2002 - Springer
The high electron mobility of GaAs and related III–V compounds renders these materials
very suitable for high-speed digital and microwave/millimeter wave applications. The …

Characteristics of GaAs heterojunction FETs (HFETs) and source follower FET logic (SFFL) inverters exposed to high energy neutrons

BK Janousek, RJ Krantz, WL Bloss… - … on Nuclear Science, 1989 - ieeexplore.ieee.org
GaAs heterojunction field-effect transistors (HFETs) and inverters and ring oscillators
comprising HFETs have been exposed to neutron fluences of 5* 10/sup 13/n/cm/sup 2/to 1 …

Neutron irradiation effects in high electron mobility transistors

B Jun, S Subramanian… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
Neutron irradiation effects on the IV characteristics of AlGaAs-GaAs high electron mobility
transistors and AlGaAs-InGaAs heterostructure insulated gate field-effect transistors are …

Theoretical analysis of proton irradiation effects on AlGaN/GaN high-electron-mobility transistors

L Lv, X Ma, H Xi, L Liu, Y Cao, J Zhang… - Journal of Vacuum …, 2015 - pubs.aip.org
To study radiation damage, the authors irradiated AlGaN/GaN high-electron-mobility
transistors with 3 MeV protons at various fluences. This irradiation caused displacement …