AlGaN/GaN diaphragm-based pressure sensor with direct high performance piezoelectric transduction mechanism

J Dzuba, G Vanko, M Držík, I Rýger, V Kutiš… - Applied Physics …, 2015 - pubs.aip.org
The piezoelectric response of AlGaN/GaN circular HEMT pressure sensing device
integrated on AlGaN/GaN diaphragm was experimentally investigated and supported by the …

Micromachined membrane structures for pressure sensors based on AlGaN/GaN circular HEMT sensing device

T Lalinský, P Hudek, G Vanko, J Dzuba, V Kutiš… - Microelectronic …, 2012 - Elsevier
A new design concept of pressure sensors based on circular high electron mobility transistor
(C-HEMT) sensing devices integrated on circular, ring and/or sequential ring AlGaN/GaN …

Low power AlGaN/GaN MEMS pressure sensor for high vacuum application

J Sun, D Hu, Z Liu, LM Middelburg, S Vollebregt… - Sensors and Actuators A …, 2020 - Elsevier
A micro-scale pressure sensor based on suspended AlGaN/GaN heterostructure is reported
with non-linear sensitivity. By sealing the cavity, vacuum sensing at various temperatures …

MEMS piezoelectric pressure sensor-modelling and simulation

V Kutiš, J Dzuba, J Paulech, J Murín, T Lalinský - Procedia Engineering, 2012 - Elsevier
The paper examines the modeling and simulation of piezoelectric MEMS pressure sensor
which is AlGaN/GaN based circular high electron mobility transistor (C-HEMT) structure. The …

Selective area deposition of diamond films on AlGaN/GaN heterostructures

T Izak, O Babchenko, V Jirásek, G Vanko… - … status solidi (b), 2014 - Wiley Online Library
Diamond‐on‐GaN heterostructure is a promising hybrid material system with a variety of
applications such as heat spreaders, high‐temperature, and high‐power devices. From a …

AlGaN/GaN C-HEMT structures for dynamic stress detection

G Vanko, M Držík, M Vallo, T Lalinský, V Kutiš… - Sensors and Actuators A …, 2011 - Elsevier
In our work, we investigated the possibility of dynamic stress detection based on the
piezoelectric polarization using AlGaN/GaN circular high electron mobility transistors (C …

Stress investigation of the AlGaN/GaN micromachined circular diaphragms of a pressure sensor

J Dzuba, G Vanko, M Držík, I Rýger… - Journal of …, 2014 - iopscience.iop.org
In this paper, selected mechanical properties of a circular AlGaN/GaN diaphragm with an
integrated circular high electron mobility transistor (HEMT) intended for pressure sensing …

Temperature-dependent stress in diamond-coated AlGaN/GaN heterostructures

T Ižák, V Jirasek, G Vanko, J Dzuba, A Kromka - Materials & Design, 2016 - Elsevier
In this study, we present a complex methodology for evaluation of the thermally induced
stress in patterned diamond microstructures. The diamond strips (2 mm in width and 0.78 or …

Effect of barrier layer thickness on AlGaN/GaN double gate MOS-HEMT device performance for high-frequency application

AB Khan, SG Anjum, MJ Siddiqui - Journal of Nanoelectronics …, 2018 - ingentaconnect.com
In this work, we have examined the effect of the AlGaN barrier layer thickness (db) of 0.5 μm
gate length AlGaN/GaN heterostructure double gate (DG) MOS-HEMT device using 2D Atlas …

Comparison of SiO2-based double passivation scheme by e-beam evaporation and PECVD for surface passivation and gate oxide in AlGaN/GaN HEMTs

C Wang, SJ Cho, NY Kim - Microelectronic engineering, 2013 - Elsevier
This study investigates and compares AlGaN/GaN high electron mobility transistors (HEMTs)
with three different configurations: an as-fabricated HEMT, a HEMT that uses SiO2 for …