Selecting optimum test compression structure (number of channels, number of scan chains,
decompressor structure etc.) for cores can reduce test time significantly. In recent times …

As the importance and complexity of System-on-Chip (SoC) testing increase, research to
enhance test efficiency is being conducted. Among these, research is ongoing to reduce the …

Design for Testability (DFT) is essential in modern Integrated Circuit (IC) design, particularly
as transistor sizes shrink and the complexity of IC's increases. Ensuring reliable testing …

Test cost has become a critical issue for large industrial integrated circuits. Various test
compression techniques have been adopted in the industry to reduce test cost. However …

In this paper, an uncertain state filling method is proposed, which can not only effectively
reduce the scan shifting power consumption, but also reduce the test time simultaneously for …

The main goal of Design for Testability (DFT) is to offer a way to test each node in the design
(Netlist) for different kinds of defects in the chip. These nodes that are to be checked by …