In medical imaging, noise can significantly obscure critical details, complicating diagnosis
and treatment. Traditional denoising techniques often struggle to maintain a balance …

In this paper, we present a new machine learning (ML) workflow with unsupervised learning
techniques to identify domains within atomic force microscopy (AFM) images obtained from …

Large-sample atomic force microscopy (AFM) is crucial in semiconductor and optics
manufacturing. However, significant mechanical vibration noise compromises imaging …

In recent years, advances in computer vision and machine learning have supported a series
of algorithms, and their ability to decipher image contents is impressive. These algorithms …