Nanoscience is a cross-sectional interdisciplinary field of research that can hardly be
overestimated in its enabling character for technologies in many application areas. A …

A new generation of electron microscopes is able to explore the microscopic properties of
materials and devices as diverse as transistors, turbine blades and interfacial …

Using state of the art scanning transmission electron microscopy (STEM) it is nowadays
possible to directly image single atomic columns at sub-Å resolution. In standard (high …

Using a highly coherent focused electron probe in a fifth-order aberration-corrected
transmission electron microscope, we report on resolving a crystal spacing less than 50 pm …

The ability of electron microscopes to analyze all the atoms in individual nanostructures is
limited by lens aberrations. However, recent advances in aberration-correcting electron …

An all-magnetic monochromator/spectrometer system for sub-30 meV energy-resolution
electron energy-loss spectroscopy in the scanning transmission electron microscope is …

A spherical aberration-corrected electron microscope has been developed recently, which is
equipped with a 300-kV cold field emission gun and an objective lens of a small chromatic …

The origins and the recent accomplishments of aberration correction in scanning
transmission electron microscopy (STEM) are reviewed. It is remembered that the successful …

The achievement of a fine electron probe for high-resolution imaging in scanning
transmission electron microscopy requires technological developments, especially in …

Since the advent of the transmission electron microscope (TEM), continuing efforts have
been made to image material under native and reaction environments that typically involve …