Computation-in-memory (CIM) is a promising solution to tackle the memory wall problem in
big data and artificial intelligence applications. One possible approach to implement such a …

Embedded System-on-Chip (SoC) memory requirements in the Automotive industry are
constantly growing. For this reason, memories occupy a significant part of Automotive SoC's …

Software-Based Self-Test (SBST) is vastly adopted as a hardware safety mechanism for the
in-field test of safety-critical systems in the form of Software Test Libraries (STLs). Typically …

Advances in integrated circuit process technology have led to new defect mechanisms, and
weak resistive defects in standard cells have received attention in addition to traditional …

Weak resistive defects in standard cells exhibit subtle electrical behaviour that may lead to
test escapes, thereby compromising the reliability of integrated circuits. Fault analysis data …

With the capability improvements in modern Systemon-Chips (SoCs), the complexity of
SoCs is increasing. Thus, manufacturers are investing heavily in designing and testing their …

Manufacturers must characterize their design deeply when designing and producing
devices like FPGAs and SoCs. Information collected through simulation and physical …

Testing an integrated circuit (IC) is the process aiming at identifying faulty products that do
not behave according to specifications. During the fabrication of IC, physical defects could …

The adoption of Cell-Aware Testing (CAT) is increasing in semiconductor companies. Past
studies have extensively shown the capability of CAT to identify physical defects of those …