Failure mechanisms driven reliability models for power electronics: A review

OE Gabriel, DR Huitink - Journal of …, 2023 - asmedigitalcollection.asme.org
Miniaturization as well as manufacturing processes that electronics devices are subjected to
often results in to increase in operational parameters such as current density, temperature …

Shear and fatigue properties of lead-free solder joints: Modeling and microstructure analysis

X Wei, MEA Belhadi, S Hamasha… - Journal of …, 2023 - asmedigitalcollection.asme.org
Abstract The reliability of Sn-Ag-Cu (SAC)-based solder alloys has been extensively
investigated after the prohibition of lead in the electronics industry owing to their toxicity. Low …

Analysis and modeling of aged SAC-Bi solder joints subjected to varying stress cycling conditions

M Jian, S Hamasha, A Alahmer, M Hamasha, X Wei… - Materials, 2023 - mdpi.com
Solder joints are subjected to varied stress cycle circumstances in the electronic packaging
service life but are also influenced by aging. There has been limited investigation into the …

Fatigue performance and microstructure of lead-free solder joints in BGA assembly at room temperature

X Wei, A Alahmer, MEA Belhadi, PP Vyas - Microelectronics Reliability, 2023 - Elsevier
One of the crucial factors in evaluating the reliability of an electronic appliance is fatigue
failure of the interconnecting solder joints. In most situations, large bulk samples are used to …

Assessing the SAC305 solder joint fatigue in ball grid array assembly using strain-controlled and stress-controlled approaches

X Wei, S Hamasha, A Alahmer… - Journal of …, 2023 - asmedigitalcollection.asme.org
One of the crucial factors in determining the reliability of an electronic device is fatigue
failure of the interconnecting solder joints. In most cases, large bulk samples are used to …

Reliability modeling of the fatigue life of lead-free solder joints at different testing temperatures and load levels using the Arrhenius model

D Bani Hani, R Al Athamneh, M Abueed… - Scientific Reports, 2023 - nature.com
Reliability of the microelectronic interconnection materials for electronic packages has a
significant impact on the fatigue properties of the electronic assemblies. This is due to the …

Power Law Creep Behavior Model Of 3rd Generation Lead-Free Alloys Considering Isothermal Aging

M Belhadi, S Hamasha… - Journal of …, 2024 - asmedigitalcollection.asme.org
In realistic applications, the solder joint is continually subjected to thermal-mechanical stress
due to the difference in the coefficient of thermal expansion (CTE) between the printed circuit …

Strength and isothermal fatigue resistance of SnBi/SnAgCu joints reflowed at low temperatures

M Yadav, T Alghoul, S Thekkut… - Journal of …, 2022 - asmedigitalcollection.asme.org
Soldered micro-electronics assemblies may have to survive a variety of mechanical loads in
repeated drops, cyclic bending, or vibration. A very large body of work has addressed the …

Investigating the Evolution of Creep Properties During Thermal Cycling of Homogeneous Lead-Free Solder Joints

MEA Belhadi, A Alahmer, Q Qasaimeh… - IEEE Transactions …, 2023 - ieeexplore.ieee.org
Electronic assemblies are continually subjected to thermal–mechanical stres, leading to
failure mainly due to creep and fatigue mechanisms. The reliability of the assembly may be …

All-electrochemical synthesis of SnBi/SnAgCu structures for low-temperature formation of high-reliability solder microjoints

M Njuki, AF Pasha, R Das, P Borgesen… - Journal of Alloys and …, 2024 - Elsevier
There is a growing interest in low temperature soldering, yet the use of low-melting point
alloys for interconnection is often hindered by reliability concerns. Eutectic tin-bismuth (SnBi) …