Comparative characterization of NWFET and FinFET transistor structures using TCAD modeling

KO Petrosyants, DS Silkin, DA Popov - Micromachines, 2022 - mdpi.com
A complete comparison for 14 nm FinFET and NWFET with stacked nanowires was carried
out. The electrical and thermal performances in two device structures were analyzed based …

Robustness evaluation of electrical characteristics of sub-22 nm FinFETs affected by physical variability

BM Kalasapati, SL Tripathi - Materials Today: Proceedings, 2022 - Elsevier
The physical parameters of digital devices have been affected by process variability The
paper is focused on subthreshold performance characterization of FET with Visual TCAD …

Distance Measurement Using Ultrasonic Sensor

RB Damala, RK Patnaik, P Korla - Smart Grids as Cyber …, 2024 - Wiley Online Library
This chapter describes an ultrasonic sensor that can gauge how far certain motor vehicle
points are from the ground. The sensor works by tracking how long an ultrasonic pulse takes …

Growth of electronic devices to circumvent the upcoming challenges from Artificial Intelligence

A Maria, R Sharma, KK Mishra - 2023 First International …, 2023 - ieeexplore.ieee.org
Large number of electronic devices based on semiconductors have been worked upon
since the discovery of first Bipolar Junction Transistor (BJT) in 1947 by Shockley. Same have …

Design and Simulation of 10‐nm SOI TRI‐Gate FinFET Using TCAD

R Mohammed, D Jayanthi, H Munja… - Smart Grids as …, 2024 - Wiley Online Library
Summary Fin Field Effect Transistor (FinFET) has proven to be an alternative to the MOSFET
in the development of low power analog and digital integrated circuits with lower short …

A review on comparative performance analysis of process parameter variations in Rectangular and Triangular FinFETs

RL Sharon, AS Edward - 2024 5th International Conference on …, 2024 - ieeexplore.ieee.org
A comparison on Rectangular and Triangular FinFETs is carried out. The results of the
TECHNOLOGY COMPUTER-AIDED DESIGN (TCAD) simulation were used to analyze the …

Towards machine learning-assisted electronic design automation: microwave filter, power amplifier, and semiconductor device

L Xue - 2024 - theses.gla.ac.uk
Over the decades of development, electronic design automation (EDA) has been widely
applied in most electronic design problems, especially in advanced and sophisticated digital …

Investigation of heavy-ion strikes on a fin field-effect transistor-based low-noise amplifier

P Rajendiran, KK Nagarajan… - … Science and Technology, 2020 - iopscience.iop.org
The consequences of heavy-ion strikes on a fin field-effect transistor-based low-noise
amplifier (LNA) are analyzed in this paper. A popular LNA topology, cascoded LNA, is …

[PDF][PDF] Comparative Characterization of NWFET and FinFET Transistor Structures Using TCAD Modeling. Micromachines 2022, 13, 1293

KO Petrosyants, DS Silkin, DA Popov - 2022 - academia.edu
A complete comparison for 14 nm FinFET and NWFET with stacked nanowires was carried
out. The electrical and thermal performances in two device structures were analyzed based …

Effect of Nickel material over the DC characteristics of a Silicon Nanowire Cylindrical MOSFET

JC Pravin, RS Jayanthi, JY Sri… - 2021 5th International …, 2021 - ieeexplore.ieee.org
This paper focuses on designing a Cylindrical Metal Oxide Semiconductor Field Effect
Transistor (MOSFET) using Sentaurus Technology Computer Aided Design (TCAD). By …