Multispectral optical confusion system: visible to infrared coloration with fractal nanostructures

I Chang, T Kim, N Lee, J Nam, JS Lim… - … Applied Materials & …, 2022 - ACS Publications
Optical confusion refers to a camouflage technique assimilated with the surroundings
through manipulating colors and patterns. With the advances in multispectral imagery …

Broad-band ultra-low-reflectivity multiscale micro–nano structures by the combination of femtosecond laser ablation and in situ deposition

T Chen, W Wang, T Tao, A Pan… - ACS Applied Materials & …, 2020 - ACS Publications
Functional surfaces with broad-band ultralow optical reflection have many potential
applications in areas like national defense and energy conversion. For efficient, high-quality …

Optical, structural, and magnetic properties of cobalt nanostructure thin films

D Schmidt, AC Kjerstad, T Hofmann… - Journal of Applied …, 2009 - pubs.aip.org
We report on optical, structural, and magnetic properties of two substantially different cobalt
nanostructure thin films deposited at an oblique angle of incidence of 85 away from the …

Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry

D Schmidt, B Booso, T Hofmann, E Schubert… - Applied Physics …, 2009 - pubs.aip.org
Generalized spectroscopic ellipsometry determines the principal monoclinic optical
constants of thin films consisting of slanted titanium nanocolumns deposited by glancing …

Optical modeling of black silicon using an effective medium/multi-layer approach

AA Elsayed, YM Sabry, F Marty, T Bourouina… - Optics …, 2018 - opg.optica.org
In this work, black silicon (BSi) structures including nanocones and nanowires are modeled
using effective medium theory (EMT), where each structure is assumed to be a multilayer …

Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films

D Schmidt, B Booso, T Hofmann, E Schubert… - Optics letters, 2009 - opg.optica.org
Generalized spectroscopic ellipsometry is used to determine the form-induced birefringence
and monoclinic optical constants of chromium columnar thin films. The slanted nanocolumns …

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

B Fodor, T Defforge, E Agócs, M Fried, G Gautier… - Applied Surface …, 2017 - Elsevier
Columnar mesoporous Si thin films and dense nanowire (SiNW) carpets were investigated
by spectroscopic ellipsometry in the visible-near-infrared wavelength range. Porous Si …

Characterization of inclined GaSb nanopillars by Mueller matrix ellipsometry

IS Nerbø, S Le Roy, M Foldyna, M Kildemo… - Journal of Applied …, 2010 - pubs.aip.org
Inclined GaSb nanopillars prepared by low energy ion sputtering with oblique ion beam
incidence have been characterized by two different Mueller matrix ellipsometric tools. The …

Generalized ellipsometry characterization of sculptured thin films made by glancing angle deposition

D Schmidt, E Schubert, M Schubert - Ellipsometry at the Nanoscale, 2013 - Springer
Generalized ellipsometry, a non-destructive optical characterization technique, is employed
to determine geometrical structure parameters and anisotropic dielectric properties of highly …

Combined micro-and nano-scale surface textures for enhanced near-infrared light harvesting in silicon photovoltaics

CH Chang, P Yu, MH Hsu, PC Tseng… - …, 2011 - iopscience.iop.org
As silicon photovoltaics evolve towards thin-wafer technologies, efficient optical absorption
for the near-infrared wavelengths has become particularly challenging. In this work, we …