T Chen, W Wang, T Tao, A Pan… - ACS Applied Materials & …, 2020 - ACS Publications
Functional surfaces with broad-band ultralow optical reflection have many potential applications in areas like national defense and energy conversion. For efficient, high-quality …
D Schmidt, AC Kjerstad, T Hofmann… - Journal of Applied …, 2009 - pubs.aip.org
We report on optical, structural, and magnetic properties of two substantially different cobalt nanostructure thin films deposited at an oblique angle of incidence of 85 away from the …
Generalized spectroscopic ellipsometry determines the principal monoclinic optical constants of thin films consisting of slanted titanium nanocolumns deposited by glancing …
In this work, black silicon (BSi) structures including nanocones and nanowires are modeled using effective medium theory (EMT), where each structure is assumed to be a multilayer …
Generalized spectroscopic ellipsometry is used to determine the form-induced birefringence and monoclinic optical constants of chromium columnar thin films. The slanted nanocolumns …
Columnar mesoporous Si thin films and dense nanowire (SiNW) carpets were investigated by spectroscopic ellipsometry in the visible-near-infrared wavelength range. Porous Si …
Inclined GaSb nanopillars prepared by low energy ion sputtering with oblique ion beam incidence have been characterized by two different Mueller matrix ellipsometric tools. The …
Generalized ellipsometry, a non-destructive optical characterization technique, is employed to determine geometrical structure parameters and anisotropic dielectric properties of highly …
As silicon photovoltaics evolve towards thin-wafer technologies, efficient optical absorption for the near-infrared wavelengths has become particularly challenging. In this work, we …