Review of nanocomposite dielectric materials with high thermal conductivity

M Lokanathan, PV Acharya, A Ouroua… - Proceedings of the …, 2021 - ieeexplore.ieee.org
Dielectric materials with high thermal conductivity (TC) can enable disruptive performance
enhancement in the areas of electronics packaging, thermal management, energy storage …

Investigation and on-board detection of gate-open failure in SiC MOSFETs

BT Vankayalapati, S Pu, F Yang… - … on Power Electronics, 2021 - ieeexplore.ieee.org
Gate-open failures in power semiconductors occur when the gate-bond wire cracks or lifts-
off leading to loss of gate control. In molded discrete devices, this failure mode may occur …

Quantification of performance variation and crack evolution of bond-wire interconnects under harsh temperature environments by S-parameter analysis

TY Kang, D Seo, J Min, TS Kim - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Electrical interconnects play important roles in both the performance and reliability of
integrated circuits. As the operating frequency has increased and products have been …

Thermal assessment and in-situ monitoring of insulated gate bipolar transistors in power electronic modules

E Gutierrez, K Lin, D DeVoto… - International …, 2019 - asmedigitalcollection.asme.org
Insulated gate bipolar transistor (IGBT) power modules are devices commonly used for high-
power applications. Operation and environmental stresses can cause these power modules …

[PDF][PDF] Methods for on-board Condition Monitoring of SiC MOSFET Based Converters

BT Vankayalapati - 2022 - utd-ir.tdl.org
The power electronics industry is continuously striving to improve the efficiency and density
of power converters. At the same time, with increasing electrification and automation across …

A novel enhancing method for terahertz imaging of integrated circuits flaw detection

JB Liu, Q Mao, L Yan, L Zeng, Y Zou, J Li, Y Li… - Physica …, 2024 - iopscience.iop.org
This research paper addresses the current gap in understanding the intricate damage types
within packaged integrated circuits (ICs). We introduce a novel multiscale latent low-rank …