C Wee, S Maikop, CY Yu - IEEE Circuits and Devices Magazine, 2005 - ieeexplore.ieee.org
Applying stress to induce appropriate strain in the channel region of metal-oxide- semiconductor field effect transistors (MOSFETs) increases both electron and hole mobilities …
L Forbes, JE Geusic, S Akram - US Patent 7,439,158, 2008 - Google Patents
APPLY FORCE TO BOW FLEXBLE SUBSTRATE WAFER a wafer with a strained semiconductor. In various embodi ments of the method, a predetermined contour is formed …
L Forbes - US Patent 7,153,753, 2006 - Google Patents
(57) ABSTRACT A process of making a strained silicon-on-insulator structure is disclosed. A recess is formed in a substrate to laterally isolate an active area. An undercutting etch forms …
In the current work, an analytical model has been developed to estimate the amount of induced stress in nanowires which are horizontally embedded with different fractions within …
The current change of n-channel polycrystalline silicon thin-film transistors is analyzed experimentally and theoretically under different strain conditions. Under the uniaxial strain …
MH Liao, PS Kuo, SR Jan, ST Chang, CW Liu - Applied physics letters, 2006 - pubs.aip.org
The variation of electron barrier height and built-in voltage of Pt Schottky diodes on the mechanically strained n-type Si and Ge is investigated experimentally and theoretically. The …
T Jiang, ZY Xia, S Sandireddy - US Patent 7,633,157, 2009 - Google Patents
Microelectronic devices and methods for manufacturing microelectronic devices are disclosed herein. In one embodiment, a device includes a support member and a flexed …