With the miniaturization of electronic packaging and devices, the size of solder joints in electronics is also decreasing from bulk solder joints to micro-bumps. Both the …
X Long, T Su, C Lu, S Wang, J Huang… - International Journal of …, 2023 - Elsevier
The development of high density and high integration of electronic chips puts forward stricter requirements on electronic packaging structures. Under the premise of lead-free rules, Sn …
HB Qin, XP Zhang, MB Zhou, JB Zeng… - Materials Science and …, 2014 - Elsevier
Solder joints are generally regarded as the weakest part in packaging systems and electronic assemblies in modern electronic products and devices. In this study, both …
HB Qin, XP Zhang, MB Zhou, XP Li, YW Mai - Microelectronics Reliability, 2015 - Elsevier
Solder joint integrity has long been recognized as a key issue affecting the reliability of integrated circuit packages. In this study, both experimental and finite element simulation …
R Tian, S Chen, J Feng, S Wang, C Hang, Y Ding… - Materials …, 2023 - Elsevier
The interfacial microstructure, shear property and fracture behaviors of Sn single bond 37Pb joints after cryogenic temperature storage for different durations were investigated in this …
H Xiao, XY Li, Y Hu, F Guo, YW Shi - Journal of alloys and compounds, 2013 - Elsevier
Thermomechanical fatigue damage is a progressive process of material degradation. The objective of this study was to investigate the damage behavior of SnAgCu/Cu solder joints …
Low cycle fatigue performance of ball grid array (BGA) structure Cu/Sn–3.0 Ag–0.5 Cu/Cu joints with different standoff heights (h, varying from 100 to 500 μm) and two pad diameters …
Low-cycle fatigue tests of Sn-Ag-Cu (SAC) Pb-free solder joints under fixed displacement were performed to evaluate the influence of Ag content (0–3 wt.%) and solder-joint geometry …