Data-driven innovation to capture user-experience product design: An empirical study for notebook visual aesthetics design

CF Chien, R Kerh, KY Lin, API Yu - Computers & Industrial Engineering, 2016 - Elsevier
Visual aesthetics is a critical factor of new product design to capture customer attention and
create positive emotional reaction to enhance the customer satisfaction. Understanding user …

Similarity matching of wafer bin maps for manufacturing intelligence to empower industry 3.5 for semiconductor manufacturing

CY Hsu, WJ Chen, JC Chien - Computers & Industrial Engineering, 2020 - Elsevier
Yield improvement is increasingly important as advanced fabrication technologies are
complicated and interrelated for semiconductor manufacturing. Wafer bin maps (WBM) …

Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement

CF Chien, CW Liu, SC Chuang - International Journal of …, 2017 - Taylor & Francis
With the shrinking feature size of integrated circuits driven by continuous technology
migrations for wafer fabrication, the control of tightening critical dimensions is critical for yield …

An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing

CF Chien, KH Chang, WC Wang - Journal of Intelligent Manufacturing, 2014 - Springer
To maintain competitive advantages, semiconductor industry has strived for continuous
technology migrations and quick response to yield excursion. As wafer fabrication has been …

Using rough set theory to recruit and retain high-potential talents for semiconductor manufacturing

CF Chien, LF Chen - IEEE Transactions on Semiconductor …, 2007 - ieeexplore.ieee.org
To recruit and retain high-potential talent is critical for semiconductor companies to maintain
competitive advantages in a modern knowledge-based economy. Conventional personnel …

A novel timetabling algorithm for a furnace process for semiconductor fabrication with constrained waiting and frequency-based setups

CF Chien, CH Chen - OR Spectrum, 2007 - Springer
This study aims to solve the scheduling problem arising from oxide–nitride–oxide (ONO)
stacked film fabrication in semiconductor manufacturing. This problem is characterized by …

Overlay error compensation using advanced process control with dynamically adjusted proportional-integral R2R controller

CF Chien, YJ Chen, CY Hsu… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
As semiconductor manufacturing reaching nanotechnology, to obtain high resolution and
alignment accuracy via minimizing overlay errors within the tolerance is crucial. To address …

Mini–max regret strategy for robust capacity expansion decisions in semiconductor manufacturing

CF Chien, JN Zheng - Journal of Intelligent Manufacturing, 2012 - Springer
Semiconductor manufacturing is capital intensive and the capacity utilization significantly
affects the capital effectiveness and profitability of semiconductor manufacturing companies …

Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing

YJ Chen, CY Fan, KH Chang - Computers & Industrial Engineering, 2016 - Elsevier
For CMOS image sensor (CIS) manufacturing, automatic optical inspection (AOI) is the
critical equipment for defect reduction and yield enhancement. The capability of automated …

Coordinating strategic outsourcing decisions for semiconductor assembly using a bi-objective genetic algorithm

JZ Wu, CF Chien, M Gen - International Journal of Production …, 2012 - Taylor & Francis
Increasing global competition has forced high-tech companies to focus on their core
competences and outsource other activities to maintain their competitive advantages in the …