In this paper, some of the latest advances in real-time load-pull technologies will be
described. A recently introduced ultralow-loss directional coupler, which has been designed …

The characterization of microwave devices under nonlinear conditions is fundamental for
device technology development, to improve device large signal model accuracy and …

US7282926B1 - Method and an apparatus for characterizing a high-frequency device-under-test
in a large signal impedance tuning environment - Google Patents US7282926B1 - Method …

A new W-band active load-pull system is presented. It is the first load-pull system to
implement a 94 GHz load by means of an active loop exploiting frequency conversion …

A measurement system for determining at least one characteristic of a device under test
(DUT) at at least one frequency is described. The measurement system includes a network …

In this article, we will introduce you to measurements for power transistor characterization:
why they matter, why they are such a complicated, highly specialized field, and where we …

An exemplary embodiment of a measurement system for conducting measurements on a
device-under-test (DUT) includes a signal transmission line, an impedance controlling tuner …

2004/01 19481 A1* 6/2004 Tsironis........................ 324f637 2004/0207426 A1* 10, 2004
Tsironis........................ 324f764 wideband (fundamental) tuners, harmonic rejection tuners or …

6,674.293 B1 1/2004 Tsironis search Error Function-based optimization algorithms allow
fast harmonic tuning for impedance tuning and matching the output of RF transistors and …

An analyzer for measuring the response of an electronic device (DUT 206) to an RF input
signal from a signal generator (240 a) is described. An active load pull circuit (201) is …