Chemical mechanical planarization for microelectronics applications

PB Zantye, A Kumar, AK Sikder - Materials Science and Engineering: R …, 2004 - Elsevier
The progressively decreasing feature size of the circuit components has tremendously
increased the need for the global surface planarization of the various thin film layers that …

Material removal mechanisms in lapping and polishing

CJ Evans, E Paul, D Dornfeld, DA Lucca, G Byrne… - CIRP annals, 2003 - Elsevier
Polishing processes are critical to high value production processes such as IC
manufacturing. The fundamental material removal mechanisms, howeve, are poorly …

Mechanical aspects of the chemical mechanical polishing process: A review

H Lee, D Lee, H Jeong - International journal of precision engineering and …, 2016 - Springer
Chemical mechanical polishing (CMP) is an essential semiconductor manufacturing process
because of its local and global planarization ability in fabricating highly integrated devices …

Chemical effect on the material removal rate in the CMP of silicon wafers

YG Wang, LC Zhang, A Biddut - Wear, 2011 - Elsevier
This paper investigates the effects of oxidizer concentration, pH and slurry flow rate on the
material removal rate (MRR) in chemo-mechanical polishing (CMP) of Si (100) wafers. The …

Effects of abrasive size distribution in chemical mechanical planarization: modeling and verification

J Luo, DA Dornfeld - IEEE Transactions on Semiconductor …, 2003 - ieeexplore.ieee.org
Recently, a comprehensive model has been developed by Luo and Dornfeld (" Material
removal mechanism in chemical mechanical polishing: theory and modeling", IEEE Trans …

A plasticity-based model of material removal in chemical-mechanical polishing (CMP)

G Fu, A Chandra, S Guha… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
It is well known that the chemical reaction between an oxide layer and a water-based slurry
produces a softer hydroxylated interface layer. During chemical-mechanical polishing …

CMP of hard disk substrate using a colloidal SiO2 slurry: preliminary experimental investigation

H Lei, J Luo - Wear, 2004 - Elsevier
With magnetic heads operating closer to hard disks, the hard disks are forced to be ultra-
smooth. At present, chemical–mechanical polishing (CMP) has become a widely accepted …

Molecular dynamics simulation of abrasive characteristics and interfaces in chemical mechanical polishing

VT Nguyen, TH Fang - Applied Surface Science, 2020 - Elsevier
Molecular dynamics simulation is employed to analyze the effect of sliding, rolling and
oscillating movements on nanotribology properties of a diamond abrasive on a silicon …

A mathematical model for chemical–mechanical polishing based on formation and removal of weakly bonded molecular species

Y Zhao, L Chang, SH Kim - Wear, 2003 - Elsevier
This paper presents a mathematical model that describes the chemical–mechanical synergy
and mechanism of material removal in chemical–mechanical polishing (CMP). The physical …

Influence of Colloidal Abrasive Size on Material Removal Rate and Surface Finish in SiO2 Chemical Mechanical Polishing

C Zhou, L Shan, JR Hight, S Danyluk, SH Ng… - Tribology …, 2002 - Taylor & Francis
This paper addresses the influence of nano-scale abrasive particle size in the polishing of
thermally-grown silicon dioxide on 100 mm diameter, p-type,(100), single crystal silicon …