Metrology for the next generation of semiconductor devices

NG Orji, M Badaroglu, BM Barnes, C Beitia… - Nature …, 2018 - nature.com
The semiconductor industry continues to produce ever smaller devices that are ever more
complex in shape and contain ever more types of materials. The ultimate sizes and …

An insight into optical metrology in manufacturing

Y Shimizu, LC Chen, DW Kim, X Chen… - Measurement …, 2021 - iopscience.iop.org
Optical metrology is one of the key technologies in today's manufacturing industry. In this
article, we provide an insight into optical measurement technologies for precision …

Rapid ordering of block copolymer thin films

PW Majewski, KG Yager - Journal of Physics: Condensed Matter, 2016 - iopscience.iop.org
Block-copolymers self-assemble into diverse morphologies, where nanoscale order can be
finely tuned via block architecture and processing conditions. However, the ultimate usage …

Catalytic activity and stability of oxides: the role of near-surface atomic structures and compositions

Z Feng, WT Hong, DD Fong, YL Lee… - Accounts of chemical …, 2016 - ACS Publications
Conspectus Electrocatalysts play an important role in catalyzing the kinetics for oxygen
reduction and oxygen evolution reactions for many air-based energy storage and …

Determining the shape and periodicity of nanostructures using small-angle x-ray scattering

DF Sunday, S List, JS Chawla… - Journal of Applied …, 2015 - scripts.iucr.org
The semiconductor industry is exploring new metrology techniques capable of meeting the
future requirement to characterize three-dimensional structure where the critical dimensions …

[PDF][PDF] 集成电路制造在线光学测量检测技术: 现状, 挑战与发展趋势

陈修国, 王才, 杨天娟, 刘佳敏, 罗成峰… - Laser & Optoelectronics …, 2022 - researching.cn
摘要在线测量检测技术与装备是保证集成电路(IC) 制造质量和良率的唯一有效技术手段, 在IC
制造过程中必须对IC 纳米结构的关键尺寸, 套刻误差, 以及缺陷等进行快速, 非破坏 …

[图书][B] Metrology and Diagnostic Techniques for Nanoelectronics

Z Ma, DG Seiler - 2017 - taylorfrancis.com
Nanoelectronics is changing the way the world communicates, and is transforming our daily
lives. Continuing Moore's law and miniaturization of low-power semiconductor chips with …

Characterizing morphology in organic systems with resonant soft X-ray scattering

JH Carpenter, A Hunt, H Ade - Journal of Electron Spectroscopy and …, 2015 - Elsevier
Resonant soft X-ray scattering (R-SoXS) has proven to be a highly useful technique for
studying the morphology of soft matter thin films due to the large intrinsic contrast between …

Inline metrology of high aspect ratio hole tilt and center line shift using small-angle x-ray scattering

P Gin, M Wormington, Y Amasay… - Journal of Micro …, 2023 - spiedigitallibrary.org
High aspect ratio (HAR) structures found in three-dimensional nand memory structures have
unique process control challenges. The etch used to fabricate channel holes several …

Small angle x-ray scattering metrology for sidewall angle and cross section of nanometer scale line gratings

T Hu, RL Jones, W Wu, EK Lin, Q Lin… - Journal of Applied …, 2004 - pubs.aip.org
High-volume fabrication of nanostructures requires nondestructive metrologies capable of
measuring not only the pattern size but also the pattern shape profile. Measurement tool …