On-line testing for VLSI—a compendium of approaches
M Nicolaidis, Y Zorian - Journal of Electronic Testing, 1998 - Springer
This paper presents an overview of a comprehensive collection of on-line testing techniques
for VLSI. Such techniques are for instance: self-checking design, allowing high quality …
for VLSI. Such techniques are for instance: self-checking design, allowing high quality …
[图书][B] Самопроверяемые дискретные устройства
ВВ Сапожников, ВВ Сапожников - 1992 - elibrary.ru
Посвящена вопросам схемотехники самопроверяемых цифровых устройств. Изложены
принципы построения самопроверяемых дискретных устройств и их свойства …
принципы построения самопроверяемых дискретных устройств и их свойства …
On-line testing for VLSI: state of the art and trends
M Nicolaidis - Integration, 1998 - Elsevier
This paper discusses the state of the art and future trends of on-line testing techniques for
VLSI. It cautions that emerging technological constraints and application requirements will …
VLSI. It cautions that emerging technological constraints and application requirements will …
Design of fast self-testing checkers for a class of Berger codes
Piestrak - IEEE transactions on computers, 1987 - ieeexplore.ieee.org
The Berger codes are optimal separable codes that detect all undirectional errors. In this
correspondence a new procedure of designing self-testing checkers (STC's) for codes with I …
correspondence a new procedure of designing self-testing checkers (STC's) for codes with I …
Concurrent checking for VLSI
M Nicolaidis, L Anghel - Microelectronic Engineering, 1999 - Elsevier
This paper presents various concurrent checking techniques for VLSI, including self-
checking circuits and concurent checking techniques for temporary faults based on time …
checking circuits and concurent checking techniques for temporary faults based on time …
The minimal test set for sorting networks and the use of sorting networks in self-testing checkers for unordered codes
SJ Piestrak - Digest of Papers. Fault-Tolerant Computing: 20th …, 1990 - computer.org
It is shown that an n-input sorting network (SN) can be used to implement all n-variable
symmetric threshold functions, using the least amount of hardware. A procedure of …
symmetric threshold functions, using the least amount of hardware. A procedure of …
A totally self-checking checker for Borden's code
NK Jha - IEEE transactions on computer-aided design of …, 1989 - ieeexplore.ieee.org
It is well known that a large number of errors in VLSI circuits are unidirectional in nature. JM
Borden (Inf. Control, vol. 53, p. 66-73, April 1982) has studied a code for detecting only t, not …
Borden (Inf. Control, vol. 53, p. 66-73, April 1982) has studied a code for detecting only t, not …
Self-checking design in Eastern Europe
SJ Piestrak - IEEE Design & Test of Computers, 1996 - ieeexplore.ieee.org
This survey introduces the design concepts of self-checking circuits and discusses research
activities in on-line hardware-checking techniques developed in Eastern Europe, including …
activities in on-line hardware-checking techniques developed in Eastern Europe, including …
Strong fault-secure and strongly self-checking domino-CMOS implementations of totally self-checking circuits
NK Jha - IEEE transactions on computer-aided design of …, 1990 - ieeexplore.ieee.org
The totally self-checking (TSC) concept is well established for applications in the area of
online error-indication. TSC circuits can detect both transient and permanent faults. They …
online error-indication. TSC circuits can detect both transient and permanent faults. They …
On TSC Checkers for m-out-of-n Codes
VV Dimakopoulos, G Sourtziotis… - IEEE transactions on …, 1995 - ieeexplore.ieee.org
Paschalis et al.(1988) have given a structured method to design TSC m-out-of-2m code
checkers suitable for VLSI implementation. In this correspondence we give sufficient …
checkers suitable for VLSI implementation. In this correspondence we give sufficient …