[HTML][HTML] Advances and opportunities in high-throughput small-scale mechanical testing

DS Gianola, NM della Ventura, GH Balbus… - Current Opinion in Solid …, 2023 - Elsevier
The quest for novel materials used in technologies demanding extreme performance has
been accelerated by advances in computational materials screening, additive manufacturing …

Fracture strength of micro-and nano-scale silicon components

FW DelRio, RF Cook, BL Boyce - Applied Physics Reviews, 2015 - pubs.aip.org
Silicon (Si) microfabrication techniques, derived from the microelectronics industry, have
enabled the development and commercialization of microelectromechanical systems …

[HTML][HTML] Nanoscale printed tunable specimen geometry enables high-throughput miniaturized fracture testing

A Jelinek, S Zak, MJ Cordill, D Kiener, M Alfreider - Materials & Design, 2023 - Elsevier
Two-photon lithography (TPL) enables the design of novel micromechanical specimens,
down to sub-micron resolution, thus extending the possibilities for device and material …

[HTML][HTML] Microscopic strength of silicon particles in an aluminium–silicon alloy

MG Mueller, M Fornabaio, G Žagar, A Mortensen - Acta Materialia, 2016 - Elsevier
A microscopic three-point bending test that measures the strength of faceted particles of high
aspect ratio is developed and used to probe individual coarsened plate-like silicon particles …

Strength distribution and fracture analyses of LiNbO3 and LiTaO3 single crystals under biaxial loading

M Gruber, I Kraleva, P Supancic, J Bielen… - Journal of the European …, 2017 - Elsevier
The strength distribution and fracture behaviour of miniaturized Lithium niobate (LiNbO 3)
and Lithium tantalate (LiTaO 3) single crystals were assessed under biaxial bending. The …

Etching process effects on surface structure, fracture strength, and reliability of single-crystal silicon theta-like specimens

MS Gaither, RS Gates, R Kirkpatrick… - Journal of …, 2013 - ieeexplore.ieee.org
The etching processes used to produce microelectromechanical systems (MEMS) leave
residual surface features that typically limit device strength and, consequently, device …

Predicting strength distributions of MEMS structures using flaw size and spatial density

RF Cook, FW DelRio, BL Boyce - Microsystems & nanoengineering, 2019 - nature.com
The populations of flaws in individual layers of microelectromechanical systems (MEMS)
structures are determined and verified using a combination of specialized specimen …

[PDF][PDF] Real-and Q-space travelling: multi-dimensional distribution maps of crystal-lattice strain (∊ 044) and tilt of suspended monolithic silicon nanowire structures

S Dolabella, R Frison, GA Chahine… - Journal of applied …, 2020 - journals.iucr.org
Silicon nanowire-based sensors find many applications in micro-and nano-
electromechanical systems, thanks to their unique characteristics of flexibility and strength …

Deformation and fracture of single-crystal silicon theta-like specimens

MS Gaither, FW DelRio, RS Gates… - Journal of Materials …, 2011 - cambridge.org
Single-crystal silicon test specimens, fabricated by lithography and deep reactive ion etching
(DRIE), were used to measure microscale deformation and fracture properties. The …

High-temperature tensile testing machine for investigation of brittle–ductile transition behavior of single crystal silicon microstructure

A Uesugi, T Yasutomi, Y Hirai… - Japanese Journal of …, 2015 - iopscience.iop.org
This paper reports development of a high-temperature tensile testing machine and testing of
single crystal silicon (SCS) for investigation of the size effect on brittle–ductile transition …