Recent interest in high-speed scanning probe microscopy for high-throughput applications
including video-rate atomic force microscopy and probe-based nanofabrication has sparked …

This paper presents a modified Prandtl-Ishlinskii (PI)(MPI) model for the asymmetric
hysteresis description and compensation of piezoelectric actuators. Considering the fact that …

In this paper, a modified repetitive control (MRC) based approach is developed for high-
speed tracking of nanopositioning stages. First, the hysteresis nonlinearity is decomposed …

Nanotechnology is the branch of science which deals with the manipulation of matters at an
extremely high resolution down to the atomic level. In recent years, atomic force microscopy …

In most nanotechnology applications, speed and precision are important requirements for
obtaining good topographical maps of material surfaces using atomic force microscopes …

This paper presents the mechanical design, optimisation and tracking control of a flexure-
based positioning stage to generate coupled linear and angular motions. The mechanism …

This paper presents a modified rate-dependent Prandtl–Ishlinskii (MRPI) model for the
description and compensation of the rate-dependent asymmetric hysteresis in piezoelectric …

Repetitive disturbances exist widely within the automation systems, which is one of the
major issues that hinder the achievement of precision operations. Dedicated to mitigating …

Atomic force microscopy (AFM) imaging has been broadly used for material topography
characterization and observation of dynamic material morphology revolution. However …

This article focuses on the design and control of nanopo-sitioning systems (nanoposi-
tioners) that operate mostly in a repetitive fashion. In addition to accuracy, speed is also a …