We present a new method to analyze quantitatively the wave front of a partially coherent x-
ray beam. The technique is based on the use of two-dimensional speckle patterns combined …

Indirect X-ray detectors are of outstanding importance for high resolution imaging, especially
at synchrotron light sources: while consisting mostly of components which are widely …

Whenever coherent radiation impinges on a scattering object, a speckled intensity pattern is
produced. In the far field the speckle size and shape do not mirror any properties of the …

A systematic study is presented in which multilayers of different composition (W/Si, Mo/Si,
Pd/B4C), periodicity (from 2.5 to 5.5 nm) and number of layers have been characterized. In …

A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J.
Synchrotron Rad. 27, 284–292] reviewed theoretically some of the available processing …

The efficiency of high-resolution pixel detectors for hard X-rays is nowadays one of the major
criteria which drives the feasibility of imaging experiments and in general the performance of …

We demonstrate computerized tomography (CT) reconstructions from absorption, phase,
and dark-field signals obtained from scans acquired when the x-ray probe light is modulated …

A new Optics Beamline coupled to a versatile UHV reflectometer is successfully operating at
BESSY-II. It is used to carry out at-wavelength characterization and calibration of in-house …

Technological advancements in X-ray imaging using bright and coherent synchrotron
sources now allows the decoupling of sample size and resolution while maintaining high …

The x-ray near-field speckle-scanning concept is an approach recently introduced to obtain
absorption, phase, and dark-field images of a sample. In this paper, we present ways of …