A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems
N di Gruttola Giardino, F Angione… - … on Defect and Fault …, 2024 - ieeexplore.ieee.org
In the past years, the complexity of Automotive System-on-Chips (SoCs) has risen
dramatically, mainly dictated by the increasing application requirements. As the complexity …
dramatically, mainly dictated by the increasing application requirements. As the complexity …
FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs
J Zhang, Z Liu, X Hu, P Liu, Z Hu, L Kuang - Electronics, 2024 - mdpi.com
The limits of chip technology are constantly being pushed with the continuous development
of integrated circuit manufacturing processes and equipment. Currently, chips contain …
of integrated circuit manufacturing processes and equipment. Currently, chips contain …
An affordable post-silicon testing framework applied to a RISC-V based microcontroller
R Molina-Robles, R García-Ramírez… - 2021 IEEE Latin …, 2021 - ieeexplore.ieee.org
The RISC-V architecture is a very attractive option for developing application specific
systems needing an affordable yet efficient central processing unit. Post-silicon validation on …
systems needing an affordable yet efficient central processing unit. Post-silicon validation on …
Design of high speed, reconfigurable multiple ICs tester using FPGA platform
B Rabakavi, S Siddamal - 2018 International Conference on …, 2018 - ieeexplore.ieee.org
As the technology shrinks complexity and density are increasing. It is required to maintain
the quality and reliability of the IC designed. High testing cost of these ATE machines, leads …
the quality and reliability of the IC designed. High testing cost of these ATE machines, leads …
FPGA based low-cost portable tester with on-board supplies
Post silicon validation is considered as an important step in the life-cycle of an integrated
circuit. With shrinking transistor size and increasing design complexity, it becomes …
circuit. With shrinking transistor size and increasing design complexity, it becomes …
Accelerating First Silicon Validation By Leveraging FPGA Capabilities
JJ Palathingal, DK Krishnan… - 2024 IEEE 8th …, 2024 - ieeexplore.ieee.org
As technology advances, maintaining the relevance of Moore's Law in research papers
leads to the development of increasingly complex chips, including heterogeneous 3D stack …
leads to the development of increasingly complex chips, including heterogeneous 3D stack …
[PDF][PDF] FPGA based low cost automatic test equipment for digital circuits
AA Bayrakci - Electrica, 2019 - dergipark.org.tr
DOI: 10.26650/electrica. 2018.28093 Testing of digital circuits is a crucialproblem. There are
two types of Automatic Test Equipment (ATE): Very precisebut complex and expensive test …
two types of Automatic Test Equipment (ATE): Very precisebut complex and expensive test …