(Pb)(Zr 0.52 Ti 0.48) O 3 (PZT) films were fabricated on La Ni O 3 (LNO)/In 2 O 3 90% Sn O 2
10%(ITO) layered transparent electrodes on glass substrates using chemical solution …

We developed a combined probe microscope—a scanning probe near-field optical
microscope (SNOM) combined with Kelvin probe force microscope (KFM) that uses a slim …

We demonstrated near-field light detection by dynamic force microscope using a self-
sensing piezoelectric cantilever having a lead zirconate titanate thin film layer. The …

We developed a scanning near-field optical microscopy (SNOM) system based on frequency-
modulation atomic force microscopy (FM-AFM), using a microfabricated force-sensing …

A bibliography is given containing 1887 references published during 2004 on piezoelectric
and pyroelectric properties of materials and their applications. It contains listings of journal …

We demonstrated near-field light detection using a non contact-mode atomic force
microscope (nc-AFM). This system obtains molecular-level resolution by reducing noise in …

抄録 Kelvin probe force microscopy (KFM), which has been a common method for studying
electrical properties of nanometer-scale structures, is a dynamic-mode atomic force …

Kelvin probe force microscopy (KFM), which has been a common method for studying
electrical properties of nanometer-scale structures, is a dynamic-mode atomic force …