Displacement damage in silicon detectors for high energy physics

M Moll - IEEE Transactions on Nuclear Science, 2018 - ieeexplore.ieee.org
In this paper, we review the radiation damage issues caused by displacement damage in
silicon sensors operating in the harsh radiation environments of high energy physics …

Radiation-induced point-and cluster-related defects with strong impact on damage properties of silicon detectors

I Pintilie, G Lindstroem, A Junkes, E Fretwurst - Nuclear Instruments and …, 2009 - Elsevier
This work focuses on the investigation of radiation-induced defects responsible for the
degradation of silicon detector performance. Comparative studies of the defects induced by …

Radiation damage in silicon exposed to high-energy protons

G Davies, S Hayama, L Murin, R Krause-Rehberg… - Physical Review B …, 2006 - APS
Photoluminescence, infrared absorption, positron annihilation, and deep-level transient
spectroscopy (DLTS) have been used to investigate the radiation damage produced by 24 …

[HTML][HTML] Investigation of point and extended defects in electron irradiated silicon—Dependence on the particle energy

R Radu, I Pintilie, LC Nistor, E Fretwurst… - Journal of Applied …, 2015 - pubs.aip.org
This work is focusing on generation, time evolution, and impact on the electrical
performance of silicon diodes impaired by radiation induced active defects. n-type silicon …

Investigation of high resistivity p-type FZ silicon diodes after 60Co γ-irradiation

C Liao, E Fretwurst, E Garutti, J Schwandt… - Nuclear Instruments and …, 2024 - Elsevier
In this work, the effects of 60 Co γ-ray irradiation on high resistivity p-type diodes have been
investigated. The diodes were exposed to dose values of 0.1, 0.2, 1, and 2 MGy. Both …

Influence of radiation induced defect clusters on silicon particle detectors

A Junkes - 2011 - osti.gov
The Large Hadron Collider (LHC) at the European Organization for Nuclear Research
(CERN) addresses some of today's most fundamental questions of particle physics, like the …

Kinetics of divacancy annealing and divacancy-oxygen formation in oxygen-enriched high-purity silicon

M Mikelsen, EV Monakhov, G Alfieri, BS Avset… - Physical Review B …, 2005 - APS
In this work the thermal kinetics of the transformation from the divacancy (V 2) to the
divacancy-oxygen (V 2 O) complex has been studied in detail, and activation energies,(E a) …

Cluster related hole traps with enhanced-field-emission—the source for long term annealing in hadron irradiated Si diodes

I Pintilie, E Fretwurst, G Lindström - Applied Physics Letters, 2008 - pubs.aip.org
Cluster related defects were investigated by the thermally stimulated current (TSC) method
in neutron irradiated n-type Si diodes during 80 C annealing. Three hole traps labeled H …

The Boron–Oxygen (BᵢOᵢ) Defect Complex Induced by Irradiation With 23 GeV Protons in p-Type Epitaxial Silicon Diodes

C Liao, E Fretwurst, E Garutti… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
In this work, the thermally stimulated current (TSC) technique has been used to investigate
the properties of the radiation-induced interstitial boron and interstitial oxygen defect …

Bistability of the BiOi complex and its implications on evaluating the “acceptor removal” process in p-type silicon

C Besleaga, A Kuncser, A Nitescu… - Nuclear Instruments and …, 2021 - Elsevier
The dependencies of the B i O i defect concentration on doping, irradiation fluence and
particle type in p-type silicon diodes have been investigated. We evidenced that large data …