[PDF][PDF] On properties of PN sequences generated by LFSR–a generalized study and simulation modeling

A Ahmad, SS Al-Busaidi… - Indian Journal …, 2013 - sciresol.s3.us-east-2.amazonaws …
This paper presents a study and developed simulation models for testing properties of
pseudo-noise sequences. A generalized approach is considered while presenting the study …

[PDF][PDF] 分布式光纤传感器的编码技术研究

林全聪, 程凌浩, 吕杰, 张天放, 梁浩, 关柏鸥 - Acta Optica Sinica, 2024 - researching.cn
摘要基于光纤中的瑞利, 布里渊, 拉曼等散射效应以及弱反射阵列的分布式光纤传感(DOFS)
能够对光纤损耗, 温度, 应变, 振动, 声音等多种参量实现长距离, 高空间分辨率的实时监测 …

Adding pseudo-random test sequence generator in the test simulator for DFT approach

A Ahmad, D Al-Abri… - Computer Technology and …, 2012 - search.proquest.com
This paper presents modified version of a realistic test tool suitable to Design For Testability
(DFT) and Built-In Self Test (BIST) environments. A comprehensive tool is developed in the …

[PDF][PDF] Development of digital logic design teaching tool using MATLAB & SIMULINK

A Ahmad, D Ruelens - IEEE Technology and Engineering …, 2013 - researchgate.net
This paper presents the description of the development of a MATLAB based tool for teaching
and tutoring of introductory digital logic circuit course. The idea of this paper is aimed to …

[PDF][PDF] Design of a probabilistic based software tool for evaluating controllability, observability and testability models of digital systems

A Ahmad, MAK Rizvi, A Al-Lawati, D Al-Abri… - Indian Journal of …, 2014 - Citeseer
This paper presents a probabilistic based software tool for estimation of digital systems'
testability. The tool allows fast computation to estimate testability in linear time complexity …

[PDF][PDF] Design of a pseudo-random binary code generator via a developed simulation model

A Ahmad, D Al-Abri - … Journal on Information Technology (ACEEE-Journal), 2012 - Citeseer
Random Binary Code generator (PRBCG). Based on extensive study of LFSR theory we
developed the simulation model of PRBCG. The developed model is faster and simulates …

Challenges for test and fault-tolerance due to convergence of electronics, semiconductor systems and computing

A Ahmad - … on Infocom Technologies and Unmanned Systems …, 2017 - ieeexplore.ieee.org
Convergence of electronics, semiconductor systems and computing are rapidly transforming
society at much faster pace than incorporation fault-tolerance and test methodologies in the …

[PDF][PDF] Investigation of typical properties of some LFSR structures

A Ahmad - Journal of System Science and Engineering, 2008 - researchgate.net
Linear Feedback Shift Registers (LFSRs) have been used for Random Bit Sequence (RBS)
generation [1]. The RBSs have been used for multiple uses in various kinds of modern …

Bit swapping linear feedback shift register for low power application using 130nm complementary metal oxide semiconductor technology

N Binti Mohd Hanib, F Choong, M Bin Ibne Reaz… - International Journal of …, 2017 - ije.ir
Bit swapping linear feedback shift register (BS-LFSR) is employed in a conventional linear
feedback shirt register (LFSR) to reduce its power dissipation and enhance its performance …

[PDF][PDF] An Approach to Measure Transition Density of Binary Sequences for X-Filling based Test Pattern Generator in Scan based Design

S Hussain, VM Rao - International Journal of Electrical and Computer …, 2018 - academia.edu
Switching activity and Transition density computation is an essential stage for dynamic
power estimation and testing time reduction. The study of switching activity, transition …