[图书][B] SiC materials and devices

M Shur, SL Rumyantsev - 2006 - books.google.com
After many years of research and development, silicon carbide has emerged as one of the
most important wide band gap semiconductors. The first commercial SiC devices? power …

Photoexcited wireless electrical stimulation elevates nerve cell growth

F Qi, R Liao, L Yang, M Yang, H Li, G Chen… - Colloids and Surfaces B …, 2022 - Elsevier
Electrical stimulation was restrained by an external power supply and wires, despite its
ability to promote nerve cell growth. Bismuth sulfide (Bi 2 S 3) offered a novel prospect for …

A new validated physically based IGCT model for circuit simulation of snubberless and series operation

H Kuhn, D Schrbder - Conference Record of the 2000 IEEE …, 2000 - ieeexplore.ieee.org
A new physically based model which is implemented in Saber MAST (R) and usable for
circuit simulation in order to calculate the static and dynamic behaviour of IGCT devices …

Parameters of electron–hole scattering in silicon carbide

TT Mnatsakanov, ME Levinshtein, PA Ivanov… - Journal of applied …, 2003 - pubs.aip.org
The parameters of electron–hole scattering EHS in silicon carbide SiC are estimated by
analyzing pulsed isothermal current–voltage characteristics of 6.0 kV 4H–SiC diodes over a …

Specific features of quasineutral carrier transport modes in semiconductors and semiconductor structures

TT Mnatsakanov, AG Tandoev, SN Yurkov… - Semiconductor …, 2009 - iopscience.iop.org
It has been demonstrated that the field dependence of the electron and hole mobility
strongly affects the carrier distribution in semiconductor structures under quasineutral …

Nonconventional quasineutral mode of carrier transport in semiconductors and semiconductor structures

TT Mnatsakanov, AG Tandoev, SN Yurkov… - Journal of Applied …, 2009 - pubs.aip.org
It is demonstrated that, in addition to the well-known quasineutral modes of carrier transport,
ie, those of quasineutral diffusion and quasineutral drift, a quasineutral mode of diffusion …

Internal laser probing techniques for power devices: analysis, modeling and simulation

R Thalhammer - 2000 - mediatum.ub.tum.de
In this thesis, a physically rigorous model for the simulation of internal laser probing
techniques for semiconductor power devices is developed which is employed for a thorough …

Paradoxes related to electron-hole scattering in junction structures

TT Mnatsakanov, ME Levinshtein… - Journal of applied …, 2005 - pubs.aip.org
Electron-hole scattering (EHS) affects the operation of all bipolar semiconductor devices at a
high current density. From a physical point of view, EHS has always been considered an …

The new equations of pn junction carrier injection level

A Baskys, M Sapurov, R Zubavicius - Elektronika ir elektrotechnika, 2013 - eejournal.ktu.lt
The new equations of minority carrier hole and electron injection levels kp and kn valid at
high-level injection have been derived. They relate the kp and kn and the voltage drop …

Effect of nonlinear physical phenomena on the photovoltaic effect in silicon p+–n–n+ solar cells

TT Mnatsakanov, VB Shuman, LI Pomortseva… - Solid-State …, 2000 - Elsevier
The influence of the combined effects of high injection level and heavy doping on the
characteristics of silicon p+–n–n+ solar cells is examined. The total amount of nonlinear …