J Zhou, XS Hu, Y Ma, J Sun, T Wei… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
CMOS scaling has greatly increased concerns for both lifetime reliability due to permanent faults and soft-error reliability due to transient faults. Most existing works only focus on one of …
J Zhou, M Zhang, J Sun, T Wang… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Heterogeneous multiprocessor system-on-chips (MPSoCs) are suitable platforms for real- time embedded applications that require powerful parallel processing capability as well as …
In this work, the reliability of complex systems under consideration of imprecision is addressed. By joining two methods coming from different fields, namely, structural reliability …
Modern digital systems pose new challenges to reliability analysts. Systems may exhibit a non-coherent behavior and time becomes an important element of the analysis due to aging …
Abstract The Resilience Articulation Point (RAP) model aims at provisioning researchers and developers with a probabilistic fault abstraction and error propagation framework …
The Birnbaum importance measure plays a central role in reliability analysis. It has initially been introduced for coherent systems, where several of its properties hold and where its …
A Mochizuki, N Onizawa, A Tamakoshi… - TENCON 2015-2015 …, 2015 - ieeexplore.ieee.org
A gate-level simulator considering a multiple-event transient (MET) is proposed to design soft-error resilient VLSI chips for harsh radiation environments. Single event transients …
In recent years, reliability has become a major issue and objective during the design of embedded systems. Here, different techniques to increase reliability like hardware-/software …
F Khosravi, M Müller, M Glaß… - Proceedings of the …, 2018 - journals.sagepub.com
Due to destructive effects like temperature and radiation, today's embedded systems have to deal with unreliable components. The intensity of these effects depends on uncertain …