Atomic force microscopy for two-dimensional materials: A tutorial review

H Zhang, J Huang, Y Wang, R Liu, X Huai, J Jiang… - Optics …, 2018 - Elsevier
Low dimensional materials exhibit distinct properties compared to their bulk counterparts. A
plethora of examples have been demonstrated in two-dimensional (2-D) materials, including …

Probing metastable space-charge potentials in a wide band gap semiconductor

A Lozovoi, H Jayakumar, D Daw, A Lakra, CA Meriles - Physical review letters, 2020 - APS
While the study of space-charge potentials has a long history, present models are largely
based on the notion of steady state equilibrium, ill-suited to describe wide band gap …

Space-and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

E Strelcov, S Jesse, YL Huang, YC Teng… - ACS …, 2013 - ACS Publications
A scanning probe microscopy-based technique for probing local ionic and electronic
transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time …

Quantitative Measurement of the Local Surface Potential of π‐Conjugated Nanostructures: A Kelvin Probe Force Microscopy Study

A Liscio, V Palermo, D Gentilini, F Nolde… - Advanced Functional …, 2006 - Wiley Online Library
We describe a systematic study on the influence of different experimental conditions on the
Kelvin probe force microscopy (KPFM) quantitative determination of the local surface …

Probing local surface potential of quasi‐one‐dimensional systems: a KPFM study of P3HT nanofibers

A Liscio, V Palermo, P Samorı - Advanced Functional Materials, 2008 - Wiley Online Library
A new model for the quantitative analysis of Kelvin Probe Force Microscopy (KPFM)
measurements of quasi‐one‐dimensional systems is presented. It is applied to precisely …

Field-effect-tuned lateral organic diodes

BM Dhar, GS Kini, G Xia, BJ Jung… - Proceedings of the …, 2010 - National Acad Sciences
The operation of organic diodes in solar cells and light-emitting displays strongly depends
on the properties of the interfaces between hole-and electron-carrying organic …

Electrostatic tip effects in scanning probe microscopy of nanostructures

CB Casper, ET Ritchie, TS Teitsworth, P Kabos… - …, 2021 - iopscience.iop.org
Electrical scanning probe microscopies (SPM) use ultrasharp metallic tips to obtain
nanometer spatial resolution and are a key tool for characterizing nanoscale …

Voltage drop in an (AlxGa1− x) 0.5 In0. 5P light-emitting diode probed by Kelvin probe force microscopy

K Katzer, W Mertin, G Bacher, A Jaeger… - Applied physics …, 2006 - pubs.aip.org
The authors report on quantitative investigations of the voltage drop across the
heterostructure layer sequence of an operating AlGaInP light-emitting diode via Kelvin probe …

Tip-modulation scanned gate microscopy

NR Wilson, DH Cobden - Nano Letters, 2008 - ACS Publications
We introduce a technique that improves the sensitivity and resolution and eliminates the
nonlocal background of scanned gate microscopy (SGM). In conventional SGM, a voltage …

Characterization of 2D transition metal dichalcogenides

P Aggarwal, A Singh, S Sorifi, M Sharma… - 2D Materials for …, 2023 - Elsevier
Abstract Properties of atomically thin two-dimensional materials (2DMs) can be modulated
by tuning their atomic thickness in a controllable manner. Thinning down 2DMs from bulk to …