Logic built-in self-test (LBIST) is now increasingly used with on-chip test compression as a
complementary solution for in-system test, where high quality, low power, low silicon area …

As cars become increasingly computerized and their safety functions are evolving rapidly,
the number of complex safety-critical components deployed in advanced driver assistance …

Under the functional safety standard ISO26262, automotive systems require testing in the
field, such as the power-on self-test (POST). Unlike the production test, the POST requires …

As cars become increasingly computerized and their safety functions evolve rapidly, the
number of complex safety-critical components deployed in advanced driver assistance …

The occurrence of silent data corruption because of hardware defects in large scale data
centers points to the advantages of applying functional test sequences to detect hardware …

This paper presents a novel low-area scan-based logic built-in self-test (LBIST) scheme that
addresses stringent test requirements of certain application domains such as the fast …

This paper presents a new staggered test pattern generation scheme. It produces
deterministic stimuli in the course of a test-per-clock-based process by using dedicated …

Test points are inserted into a circuit to improve its testability or diagnosability. The
diagnosability goal may be to reduce the number of indistinguished fault pairs, increase the …

Test sets that target standard fault models may not always be sufficient for detecting all
defects. To evaluate test sets for the detection of unmodeled defects, n-detect test sets …

Power-on self-test is an efficient means for covering safety-critical faults in automotive
systems. This paper presents a multicycle logic BIST technique that avoids fault masking …