Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network
RS Ram, MLC Prabhaker - Journal of Electronic Testing, 2023 - Springer
With advanced technology, the latest Very Large Scale Integration (VLSI) circuit designs are
manufactured. In advanced technology-centered circuits, new design-specific, as well as …
manufactured. In advanced technology-centered circuits, new design-specific, as well as …
Application dependent FPGA interconnect test method with small test configuration number using SMT net-grouping constraints
X He, J Lai - IEICE Electronics Express, 2024 - jstage.jst.go.jp
An application dependent FPGA interconnect testing scheme is presented. The goal is to
reduce the number of test configurations while keeping high fault coverage. Reduction is …
reduce the number of test configurations while keeping high fault coverage. Reduction is …
A Novel Approach for Offline and Online Application-Dependent testing of FPGA interconnects
A Menbari, H Rahimi… - 2023 5th Iranian …, 2023 - ieeexplore.ieee.org
FPGA interconnection network is tested primarily using application-dependent testing, which
tests only the resources used in a particular application instead of testing all FPGA …
tests only the resources used in a particular application instead of testing all FPGA …
Структури даних для дедуктивного моделювання умовних операторів HDL
Анотація Предметом дослідження є кубітно-векторні моделі опису комбінаційних схем і
процедури дедуктивного моделювання несправностей на основі цих моделей. Об'єкт …
процедури дедуктивного моделювання несправностей на основі цих моделей. Об'єкт …