The creation of soft errors due to the propagation of single event transients (SETs) is a
significant reliability challenge in modern CMOS logic. SET concerns continue to be …

This paper reviews the status of research in modeling and simulation of single-event effects
(SEE) in digital devices and integrated circuits, with a special emphasis on the current …

Graphics processing units (GPUs) are playing a critical role in convolutional neural networks
(CNNs) for image detection. As GPU-enabled CNNs move into safety-critical environments …

The once-ephemeral radiation-induced soft error has become a key threat to advanced
commercial electronic components and systems. Left unchallenged, soft errors have the …

Physical mechanisms responsible for nondestructive single-event effects in digital
microelectronics are reviewed, concentrating on silicon MOS devices and integrated circuits …

This paper examines the effect of technology scaling and microarchitectural trends on the
rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to …

As the dimensions and operating voltages of computer electronics shrink to satisfy
consumers' insatiable demand for higher density, greater functionality, and lower power …

Advances in microelectronics performance and density continue to be fueled by the engine
of Moore's law. Although lately this engine appears to be running out of steam, recent …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

The increased operating frequencies, geometry shrinking and power supply reduction that
accompany the process of very deep submicron scaling, affect the reliable operation of very …