Characterization of ferroelectric domain walls by scanning electron microscopy

KA Hunnestad, ED Roede, ATJ van Helvoort… - Journal of Applied …, 2020 - pubs.aip.org
Ferroelectric domain walls are a completely new type of functional interface, which have the
potential to revolutionize nanotechnology. In addition to the emergent phenomena at …

Effects of laser energy and wavelength on the analysis of LiFePO4 using laser assisted atom probe tomography

D Santhanagopalan, DK Schreiber, DE Perea… - Ultramicroscopy, 2015 - Elsevier
The effects of laser wavelength (355 nm and 532 nm) and laser pulse energy on the
quantitative analysis of LiFePO 4 by atom probe tomography are considered. A systematic …

Phosphorus doping of Si nanocrystals embedded in silicon oxynitride determined by atom probe tomography

H Gnaser, S Gutsch, M Wahl, R Schiller… - Journal of Applied …, 2014 - pubs.aip.org
Silicon nanocrystals (SiNCs) embedded in a silicon oxide matrix were studied by 3D atom
probe tomography (APT). The distribution of the SiNC diameter was found to have a mean …

Erbium emission in Er:Y2O3 decorated fractal arrays of silicon nanowires

MJ Lo Faro, AA Leonardi, F Priolo, B Fazio… - Scientific Reports, 2020 - nature.com
Disordered materials with new optical properties are capturing the interest of the scientific
community due to the observation of innovative phenomena. We present the realization of …

Thermodynamic theory of phase separation in nonstoichiometric Si oxide films induced by high-temperature anneals

A Sarikov - Nanomanufacturing, 2023 - mdpi.com
High-temperature anneals of nonstoichiometric Si oxide (SiOx, x< 2) films induce phase
separation in them, with the formation of composite structures containing amorphous or …

Field ion emission in an atom probe microscope triggered by femtosecond-pulsed coherent extreme ultraviolet light

AN Chiaramonti, L Miaja-Avila… - Microscopy and …, 2020 - academic.oup.com
This paper describes initial experimental results from an extreme ultraviolet (EUV) radiation-
pulsed atom probe microscope. Femtosecond-pulsed coherent EUV radiation of 29.6 nm …

Optimization and characterization of electrodeposited cadmium selenide on monocrystalline silicon

W Giurlani, M Vizza, AA Leonardi, MJ Lo Faro, A Irrera… - Nanomaterials, 2022 - mdpi.com
In this work, the optimal conditions for the electrodeposition of a CdSe film on n-Si were
demonstrated. The structural and optical properties of the bare films and after annealing …

Doping porous silicon with erbium: pores filling as a method to limit the Er-clustering effects and increasing its light emission

G Mula, T Printemps, C Licitra, E Sogne, F D'Acapito… - Scientific Reports, 2017 - nature.com
Er clustering plays a major role in hindering sufficient optical gain in Er-doped Si materials.
For porous Si, the long-standing failure to govern the clustering has been attributed to …

Microstructure and optical properties of Pr3+-doped hafnium silicate films

YT An, C Labbé, L Khomenkova, M Morales… - Nanoscale research …, 2013 - Springer
In this study, we report on the evolution of the microstructure and photoluminescence
properties of Pr 3+-doped hafnium silicate thin films as a function of annealing temperature …

Infiltration of Erbium ions (Er3+) in Porous Silicon Layer Synthesized by Electrochemical Method: Structural and Optical Properties Studies

D Kehil, S Rahmouni, N Boukhenoufa, A Djebli… - Silicon, 2024 - Springer
Porous silicon (Psi) has recently attracted considerable attention because of its unique
optical and structural properties and capacity to be used in various applications. Due to the …