Hybrid organic/inorganic perovskites (HOIPs) are of great interest for optoelectronic
applications due to their quality electronic and optical properties and the exceptional ease of …

Spectroscopic snap-shot ellipsometry of co-axial structure is proposed to solve the large
spot size and long measurement time issues of the conventional ellipsometer. By …

We propose a polarized, angle-resolved spectral (PARS) reflectometry for simultaneous
thickness and refractive-index measurement of ultra-thin films in real time. This technology …

Optical anisotropy offers an extra degree of freedom to dynamically and reversibly regulate
polarizing optical components, such as polarizers, without extra energy consumption and …

In this Letter, we describe a new, to the best of our knowledge, concept of angle-resolved
spectral reflectometry with a pixelated polarizing camera for determination of the thickness of …

Angle-resolved ellipsometry with back focal plane imaging has been found to be of
increasing importance in recent industrial sensing by virtue of its rich information provided at …

We describe an instantaneous measurement scheme of multispectral angle-resolved
ellipsometry with a color camera. A back focal plane image captured by the color camera …

We describe a novel approach for angle-resolved spectral reflectometry using a digital light
processing (DLP) projector. Here, the DLP generates ring patterned images which are …

Micro-ellipsometry, an on-axis optical configuration, offers submicron spatial resolution
compared to conventional ellipsometry. However, its lower precision, inaccurate system …

According to the nature of multiple linear regression evaluation method, the quantitative
evaluation method of teachers is divided into quantitative evaluation method and qualitative …