Powder materials are used in all corners of materials science, from additive manufacturing to
energy storage. Scanning electron microscopy (SEM) has developed to meet morphological …

Image formation in scanning electron microscopy (SEM) is a combination of physical
processes, electron emissions from the sample, and of a technical process related to the …

The resolution capability of the scanning electron microscope has increased immensely in
recent years, and is now within the sub-nanometre range, at least for inorganic materials. An …

The secondary electron (SE) imaging of several samples across a range of scanning
electron microscopes (SEM) and SE detectors under matched operating conditions has …

The helium ion microscope (HeIM) holds immense promise for nano-engineering and
imaging with scope for in-situ chemical analysis. Here we will examine the potential of …

Nanowires have many interesting properties that are of advantage for solar cells, such as
the epitaxial combination of lattice-mismatched materials without plastic deformation. This …

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method
of imaging the surface of nanostructures. However, most SEM detectors simply count the …

The scanning electron microscope provides a platform for subnanometer resolution
characterization of material morphology with excellent topographic and chemical contrast …

We first review the significance of resolution and contrast in electron microscopy and the
effect of the electron optics on these two quantities. We then outline the physics of the …

We calculate a universal shift in work function of 59.4 meV per decade of dopant
concentration change that applies to all doped semiconductors and from this use Monte …