Gallium nitride bulk crystal growth processes: A review

A Denis, G Goglio, G Demazeau - Materials Science and Engineering: R …, 2006 - Elsevier
Optoelectrical and microelectronic devices involving gallium nitride have become a
challenge but their development is limited because of a lack of suitable substrates. This …

New materials for radiation hard semiconductor dectectors

PJ Sellin, J Vaitkus - Nuclear Instruments and Methods in Physics …, 2006 - Elsevier
We present a review of the current status of research into new semiconductor materials for
use as particle tracking detectors in very high radiation environments. This work is carried …

Gallium nitride crystals and wafers and method of making

MP D'evelyn, DS Park, SF Leboeuf… - US Patent …, 2006 - Google Patents
(57) ABSTRACT A GaN crystal having up to about 5 mole percent of at least one of
aluminum, indium, and combinations thereof. The GaN crystal has at least one grain having …

Research progress in the postprocessing and application of GaN crystal

Q Li, J Yu, S Wang, G Wang, G Liu, L Liu, S Zhang… - …, 2023 - pubs.rsc.org
As a typical representative of the third-generation semiconductor materials, GaN is an ideal
substrate for the fabrication of blue-green lasers, RF microwave devices, and power …

Gallium nitride crystal and method of making same

MP D'evelyn, DS Park, S LeBoeuf, L Rowland… - US Patent …, 2006 - Google Patents
There is provided a GaN single crystal at least about 2 millimeters in diameter, with a
dislocation density less than about 10 4 cm− 1, and having no tilt boundaries. A method of …

Blue and near-ultraviolet light-emitting diodes on free-standing GaN substrates

XA Cao, SF LeBoeuf, MP D'evelyn, SD Arthur… - Applied physics …, 2004 - pubs.aip.org
Blue and near-ultraviolet (UV) InGaN/GaN multiple-quantum-well light-emitting diodes
(LEDs) with peak emission at 465 nm and 405 nm, respectively, were grown on GaN and …

Gallium nitride crystals and wafers and method of making

MP D'evelyn, D Park, SF Leboeuf, LB Rowland… - US Patent …, 2010 - Google Patents
EP O 937 790 8, 1999 EP O966047 12/1999 EP 1 172 464 1, 2002 EP 1249 522 10, 2002
FR 2796 657 1, 2001 JP 11 171699 9, 1999 JP 200022212 A 1, 2000 WO WO96, 41906 …

Growth and characterization of GaN PiN rectifiers on free-standing GaN

XA Cao, H Lu, SF LeBoeuf, C Cowen, SD Arthur… - Applied Physics …, 2005 - pubs.aip.org
GaN PiN rectifiers with high structural quality were grown on free-standing GaN substrates
using metalorganic chemical vapor deposition. The lattice mismatch between the substrate …

Synchrotron radiation x-ray topography and defect selective etching analysis of threading dislocations in GaN

S Sintonen, M Rudziński, S Suihkonen… - Journal of Applied …, 2014 - pubs.aip.org
The crystal quality of bulk GaN crystals is continuously improving due to advances in GaN
growth techniques. Defect characterization of the GaN substrates by conventional methods …

Crystalline composition, wafer, and semi-conductor structure

MP D'evelyn, DS Park, SF Leboeuf… - US Patent …, 2009 - Google Patents
(57) ABSTRACT A crystalline composition is provided. The crystalline com position may
include gallium and nitrogen; and the crystal line composition may have an infrared …