Vibrational spectroscopy in the electron microscope

OL Krivanek, TC Lovejoy, N Dellby, T Aoki… - Nature, 2014 - nature.com
Vibrational spectroscopies using infrared radiation,, Raman scattering, neutrons, low-energy
electrons and inelastic electron tunnelling are powerful techniques that can analyse bonding …

Multimode Electron Tomography Sheds Light on Synthesis, Structure, and Properties of Complex Metal‐Based Nanoparticles

K Jenkinson, LM Liz‐Marzán, S Bals - Advanced Materials, 2022 - Wiley Online Library
Electron tomography has become a cornerstone technique for the visualization of
nanoparticle morphology in three dimensions. However, to obtain in‐depth information …

[图书][B] Electron energy-loss spectroscopy in the electron microscope

RF Egerton - 2011 - books.google.com
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard
analytical technique used in the transmission electron microscope to extract chemical and …

Analytical transmission electron microscopy

W Sigle - Annu. Rev. Mater. Res., 2005 - annualreviews.org
▪ Abstract Chemical analysis at high spatial resolution is the domain of analytical
transmission electron microscopy. Owing to rapid instrumental developments during the past …

[图书][B] Handbook of surface and interface analysis: methods for problem-solving

JC Riviere, S Myhra - 2009 - taylorfrancis.com
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was
based on the authors' firm belief that characterization and analysis of surfaces should be …

Metal particle catalysed production of nanoscale BN structures

M Terrones, WK Hsu, H Terrones, JP Zhang… - Chemical physics …, 1996 - Elsevier
Graphite-like nanostructures including nanotubes and encapsulated polyhedral particles
have been obtained by arcing hexagonal boron nitride (h-BN) and tantalum in a nitrogen …

[图书][B] Aberration-corrected imaging in transmission electron microscopy: An introduction

R Erni - 2015 - books.google.com
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction
to aberration-corrected atomic-resolution electron microscopy imaging in materials and …

A new method for the determination of the wave aberration function for high resolution TEM: 1. Measurement of the symmetric aberrations

RR Meyer, AI Kirkland, WO Saxton - Ultramicroscopy, 2002 - Elsevier
A new method for the accurate determination of the symmetric coefficients of the wave
aberration function has been developed. The relative defoci and displacements of images in …

Quantitative analysis of EFTEM elemental distribution images

F Hofer, W Grogger, G Kothleitner, P Warbichler - Ultramicroscopy, 1997 - Elsevier
Energy-filtering TEM (EFTEM) can be used to record elemental distribution images at
nanometer resolution and with short acquisition times. In this paper we show how elemental …

The impact of STEM aberration correction on materials science

SJ Pennycook - Ultramicroscopy, 2017 - Elsevier
Over the last three decades the scanning transmission electron microscope (STEM) has
gone from a specialized instrument for nanoscale analysis to the microscope of choice for …