Cluster secondary ion mass spectrometry (cluster SIMS) has played a critical role in the
characterization of polymeric materials over the last decade, allowing for the ability to obtain …

This article provides a perspective on collisions of ions with surfaces, including surface-
induced dissociation (SID) and reactive ion scattering spectrometry (RISS). The content is …

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has unique capabilities in the
area of high-resolution mass spectrometric imaging of biological samples. The technique …

The present theoretical study explores the interaction of various energetic molecular
projectiles and clusters with a model polymeric surface, with direct implications for surface …

The advantages and drawbacks of using either monatomic or buckminsterfullerene primary
ions for metal-assisted secondary ion mass spectrometry (MetA-SIMS) are investigated …

Three-dimensional (3D) chemical images reveal the surface and subsurface distribution of
pharmaceutical molecules in a coronary stent coating and are used to visualize the drug …

Buckminsterfullerene projectiles have demonstrated their outstanding capabilities for the
secondary ion mass spectrometric (SIMS) analysis of bulk organic films. In this contribution …

Background: The homogeneity of photoacid generator (PAG) is a critical factor influencing
the resolving capability and the sidewall roughness of a photoresist, yet fundamental …

An organic delta layer system made of alternating Langmuir− Blodgett multilayers of barium
arachidate (AA) and barium dimyristoyl phosphatidate (DMPA) was constructed to elucidate …

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a technique to analyse the
chemical composition of surfaces. In TOF-SIMS, the sample surface is bombarded in vacuo …