[HTML][HTML] Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale

RK Vasudevan, N Balke, P Maksymovych… - Applied Physics …, 2017 - pubs.aip.org
Ferroelectric materials have remained one of the major focal points of condensed matter
physics and materials science for over 50 years. In the last 20 years, the development of …

Bayesian active learning for scanning probe microscopy: From Gaussian processes to hypothesis learning

M Ziatdinov, Y Liu, K Kelley, R Vasudevan, SV Kalinin - ACS nano, 2022 - ACS Publications
Recent progress in machine learning methods and the emerging availability of
programmable interfaces for scanning probe microscopes (SPMs) have propelled …

Nanoscale ferroelectrics: processing, characterization and future trends

A Gruverman, A Kholkin - Reports on Progress in Physics, 2005 - iopscience.iop.org
This review paper summarizes recent advances in the quickly developing field of nanoscale
ferroelectrics, analyses its current status and considers potential future developments. The …

Surface-screening mechanisms in ferroelectric thin films and their effect on polarization dynamics and domain structures

SV Kalinin, Y Kim, DD Fong… - Reports on Progress in …, 2018 - iopscience.iop.org
For over 70 years, ferroelectric materials have been one of the central research topics for
condensed matter physics and material science, an interest driven both by fundamental …

Electromechanical imaging and spectroscopy of ferroelectric and piezoelectric materials: state of the art and prospects for the future

N Balke, I Bdikin, SV Kalinin… - Journal of the American …, 2009 - Wiley Online Library
Piezoresponse force microscopy (PFM) has emerged as a powerful and versatile tool for
probing nanoscale phenomena in ferroelectric materials on the nanometer and micrometer …

Vector piezoresponse force microscopy

SV Kalinin, BJ Rodriguez, S Jesse, J Shin… - Microscopy and …, 2006 - cambridge.org
A novel approach for nanoscale imaging and characterization of the orientation dependence
of electromechanical properties—vector piezoresponse force microscopy (Vector PFM)—is …

Big, deep, and smart data in scanning probe microscopy

SV Kalinin, E Strelcov, A Belianinov, S Somnath… - 2016 - ACS Publications
Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and
nanotechnology by enabling imaging and manipulation of the structure and functionality of …

Contact mechanics and tip shape in AFM-based nanomechanical measurements

M Kopycinska-Müller, RH Geiss, DC Hurley - Ultramicroscopy, 2006 - Elsevier
Stiffness–load curves obtained in quantitative atomic force acoustic microscopy (AFAM)
measurements depend on both the elastic properties of the sample and the geometry of the …

Epitaxial ferroelectric interfacial devices

CAF Vaz, YJ Shin, M Bibes, KM Rabe… - Applied Physics …, 2021 - pubs.aip.org
Ferroelectric interfacial devices consist of materials systems whose interfacial electronic
properties (such as a 2D electron gas or an interfacial magnetic spin configuration) are …

Dynamic behaviour in piezoresponse force microscopy

S Jesse, AP Baddorf, SV Kalinin - Nanotechnology, 2006 - iopscience.iop.org
Frequency-dependent dynamic behaviour in piezoresponse force microscopy (PFM)
implemented on a beam-deflection atomic force microscope (AFM) is analysed using a …