Novel charm of 2D materials engineering in memristor: when electronics encounter layered morphology

S Batool, M Idrees, SR Zhang, ST Han, Y Zhou - Nanoscale Horizons, 2022 - pubs.rsc.org
The family of two-dimensional (2D) materials composed of atomically thin layers connected
via van der Waals interactions has attracted much curiosity due to a variety of intriguing …

A review of InP/InAlAs/InGaAs based transistors for high frequency applications

J Ajayan, D Nirmal - Superlattices and Microstructures, 2015 - Elsevier
This paper presents an overview of the rapid progress being made in the development of
InP based devices for high speed applications. Over the past few decades, major aero …

Dual-Gate MOSFET With Atomic-Layer-Deposited as Top-Gate Dielectric

H Liu, DY Peide - IEEE electron device letters, 2012 - ieeexplore.ieee.org
We demonstrate atomic-layer-deposited (ALD) high-k dielectric integration on 2-D layer-
structured molybdenum disulfide (MoS 2) crystals and MoS 2 dual-gate n-channel MOSFETs …

[PDF][PDF] Octopus-inspired smart adhesive pads for transfer printing of semiconducting nanomembranes

H Lee, DS Um, Y Lee, S Lim, H Kim, H Ko - Adv. Mater, 2016 - polympart.com
DOI: 10.1002/adma. 201601407 to control the pressure inside the suckers and thus the
pressure difference between the inside and outside of the suckers, resulting in the …

Interface engineering and chemistry of Hf-based high-k dielectrics on III–V substrates

G He, X Chen, Z Sun - Surface Science Reports, 2013 - Elsevier
Recently, III–V materials have been extensively studied as potential candidates for post-Si
complementary metal-oxide-semiconductor (CMOS) channel materials. The main obstacle …

The integration of high-k dielectric on two-dimensional crystals by atomic layer deposition

H Liu, K Xu, X Zhang, PD Ye - Applied Physics Letters, 2012 - pubs.aip.org
We investigate the integration of Al 2 O 3 high-k dielectric on two-dimensional (2D) crystals
of boron nitride (BN) and molybdenum disulfide (MoS 2) by atomic layer deposition (ALD) …

Enhanced stability of black phosphorus field-effect transistors with SiO2 passivation

B Wan, B Yang, Y Wang, J Zhang, Z Zeng, Z Liu… - …, 2015 - iopscience.iop.org
Few-layer black phosphorus (BP) has attracted much attention due to its high mobility and
suitable band gap for potential applic5ations in optoelectronics and flexible devices …

Gate oxides beyond SiO2

DG Schlom, S Guha, S Datta - MRS bulletin, 2008 - cambridge.org
This year marks a major materials milestone in the makeup of silicon-based field-effect
transistors: in the microprocessors produced by leading manufacturers, the SiO2 gate …

Defect state passivation at III-V oxide interfaces for complementary metal–oxide–semiconductor devices

J Robertson, Y Guo, L Lin - Journal of Applied Physics, 2015 - pubs.aip.org
The paper describes the reasons for the greater difficulty in the passivation of interface
defects of III–V semiconductors like GaAs. These include the more complex reconstructions …

Main determinants for III–V metal-oxide-semiconductor field-effect transistors

PD Ye - Journal of Vacuum Science & Technology A, 2008 - pubs.aip.org
Lacking a suitable gate insulator, practical GaAs metal-oxide-semiconductor field-effect
transistors (MOSFETs) have remained all but a dream for more than four decades. The …