Semiconductor nanowires: to grow or not to grow?

PC McIntyre, AF i Morral - Materials Today Nano, 2020 - Elsevier
Semiconductor nanowires have demonstrated exciting properties for nanophotonics,
sensors, energy technologies, and end-of-roadmap and beyond-roadmap electronic …

Growth and applications of GeSn-related group-IV semiconductor materials

S Zaima, O Nakatsuka, N Taoka… - … and technology of …, 2015 - iopscience.iop.org
We review the technology of Ge 1− x Sn x-related group-IV semiconductor materials for
developing Si-based nanoelectronics. Ge 1− x Sn x-related materials provide novel …

Increased photoluminescence of strain-reduced, high-Sn composition Ge1− xSnx alloys grown by molecular beam epitaxy

R Chen, H Lin, Y Huo, C Hitzman, TI Kamins… - Applied physics …, 2011 - pubs.aip.org
We synthesized up to Ge 0.914 Sn 0.086 alloys on (100) GaAs/In y Ga 1− y As buffer layers
using molecular beam epitaxy. The buffer layers enable engineered control of strain in the …

Undoped and in-situ B doped GeSn epitaxial growth on Ge by atmospheric pressure-chemical vapor deposition

B Vincent, F Gencarelli, H Bender, C Merckling… - Applied Physics …, 2011 - pubs.aip.org
In this letter, we propose an atmospheric pressure-chemical vapor deposition technique to
grow metastable GeSn epitaxial layers on Ge. We report the growth of defect free fully …

Mobility behavior of Ge1-xSnx layers grown on silicon-on-insulator substrates

O Nakatsuka, N Tsutsui, Y Shimura… - Japanese Journal of …, 2010 - iopscience.iop.org
We have investigated the behaviors of the carrier mobility and concentration of the undoped
Ge 1-x Sn x layers epitaxially grown on silicon-on-insulator (SOI) substrates. Hall …

Low temperature growth of Ge1− xSnx buffer layers for tensile–strained Ge layers

Y Shimura, N Tsutsui, O Nakatsuka, A Sakai, S Zaima - Thin Solid Films, 2010 - Elsevier
We have investigated the dependence of Sn precipitation and crystallinity of Ge1− xSnx
layers on the growth temperature. We also demonstrated a growth of a tensile–strained Ge …

SiGeSn buffer layer for the growth of GeSn films

GG Jernigan, NA Mahadik, ME Twigg… - Journal of Applied …, 2023 - pubs.aip.org
Inclusion of Si atoms to the growth surface during the molecular beam epitaxy of Ge and Sn
to form a SiGeSn alloy was identified as a reactive surface species and as a means to …

Study of strain evolution mechanism in Ge1− xSnx materials grown by low temperature molecular beam epitaxy

F Wan, C Xu, X Wang, G Xu, B Cheng, C Xue - Journal of Crystal Growth, 2022 - Elsevier
Ge 1− x Sn x materials with constant and step-graded compositions have been successfully
grown on Ge/Si (0 0 1) substrates by using low temperature molecular beam epitaxy (LT …

Development of light emitting group IV ternary alloys on Si platforms for long wavelength optoelectronic applications

L Jiang, C Xu, JD Gallagher, R Favaro, T Aoki… - Chemistry of …, 2014 - ACS Publications
This paper describes preparation of a new class of Ge1–x–y Si x Sn y direct-gap
semiconductors grown on Ge-buffered Si substrates via depositions of trigermane (Ge3H8) …

Introduction of measurement techniques in ultrasonic electronics: Basic principles and recent trends

K Mizutani, N Wakatsuki, T Ebihara - Japanese Journal of …, 2016 - iopscience.iop.org
Measurement—the act of measuring physical properties that we perform—has the potential
to contribute to the successful advancement of sciences and society. To open doors in …