A Tsiara, A Leśniewska, P Roussel… - 2022 IEEE …, 2022 - ieeexplore.ieee.org
Reliability analysis on Ge Electro-Absorption Modulators suggest that different physical mechanisms are involved in the dark current degradation during electrical stress. An" …
We report 35 GHz Ge-on-Si avalanche photodetectors integrated on 300-mm SOI wafers, enabling high-quality eye diagrams at 50 Gbps NRZ, and low thermal drift of the breakdown …
The information and telecommunication industry relies heavily on the opto-electronic (OE) modulator link between electronic computation and optical data transmission. Asglobal data …