Surface, interface, and thin-film magnetism

LM Falicov, DT Pierce, SD Bader, R Gronsky… - Journal of Materials …, 1990 - cambridge.org
A comprehensive review and state of the art in the field of surface, interface, and thin-film
magnetism is presented. New growth techniques which produce atomically engineered …

Magnetic force microscopy of thin film media for high density magnetic recording

S Porthun, L Abelmann, C Lodder - Journal of magnetism and magnetic …, 1998 - Elsevier
This paper discusses various aspect of magnetic force microscopy (MFM) for use in the field
of high density magnetic recording. After an introduction of the most important magnetic …

[图书][B] Atomic force microscopy

P Eaton, P West - 2010 - books.google.com
Atomic force microscopy is an amazing technique that allies a versatile methodology (that
allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented …

[PDF][PDF] Scanning force microscopy-with applications to electric, magnetic and atomic forces

D Sarid, R Coratger, F Ajustron… - Microscopy …, 1991 - mmm.edpsciences.org
In a Scanning Tunneling Microscope [1], an electronic current flows through the tunneling
barrier be-tween an atomically sharp tip and a conductive surface. Roughly speaking, the …

[图书][B] Scanning probe microscopy: the lab on a tip

E Meyer, HJ Hug, R Bennewitz - 2004 - Springer
Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

Magnetic force microscopy: General principles and application to longitudinal recording media

D Rugar, HJ Mamin, P Guethner, SE Lambert… - Journal of Applied …, 1990 - pubs.aip.org
This paper discusses the principles of magnetic force microscopy (MFM) and its application
to magnetic recording studies. We use the ac detection method which senses the force …

High‐resolution capacitance measurement and potentiometry by force microscopy

Y Martin, DW Abraham, HK Wickramasinghe - Applied Physics Letters, 1988 - pubs.aip.org
We demonstrate the usefulness and high sensitivity of the atomic force microscope (AFM) for
imaging surface dielectric properties and for potentiometry through the detection of …

Scanning Hall probe microscopy

AM Chang, HD Hallen, L Harriott, HF Hess… - Applied physics …, 1992 - pubs.aip.org
We describe the implementation of a scanning Hall probe microscope of outstanding
magnetic field sensitivity (-0.1 G) and unprecedented spatial resolution (-0.35 pm) to detect …

[图书][B] Physical methods for materials characterisation

PEJ Flewitt, RK Wild - 2017 - taylorfrancis.com
This completely revised and expanded new edition covers the full range of techniques now
available for the investigation of materials structure and accurate quantitative determination …

Real-time scanning Hall probe microscopy

A Oral, S Bending, M Henini - Applied physics letters, 1996 - pubs.aip.org
We describe a low-noise scanning Hall probe microscope having unprecedented magnetic
field sensitivity (2.910 8 T/Hz at 77 K, high spatial resolution, 0.85 m, and operating in real …