A review of thickness measurements of thick transparent layers using optical interferometry

J Park, JA Kim, H Ahn, J Bae, J Jin - International Journal of Precision …, 2019 - Springer
Thickness is a typical parameter related to length, of which measurements are conducted in
various industrial fields, such as the automotive, aviation, ship-building, semiconductor, and …

Refractive index measurement of pharmaceutical solids: a review of measurement methods and pharmaceutical applications

S Mohan, E Kato, JK Drennen III… - Journal of Pharmaceutical …, 2019 - Elsevier
Refractive index is an important optical parameter that can be used to characterize the
physicochemical properties of pharmaceutical solids. The complexity of most drugs and …

Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer

K Hibino, BF Oreb, PS Fairman, J Burke - Applied Optics, 2004 - opg.optica.org
Wavelength-scanning interferometry permits the simultaneous measurement of variations in
surface shape and optical thickness of a nearly parallel plate. Interference signals from both …

Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness

MR Jafarfard, S Moon, B Tayebi, DY Kim - Optics letters, 2014 - opg.optica.org
We present a quantitative phase microscopy scheme that simultaneously acquires two
phase images at different wavelengths. The simultaneous dual-wavelength measurement …

Measurement of refractive index and thickness of transparent plate by dual-wavelength interference

HJ Choi, HH Lim, HS Moon, TB Eom, JJ Ju, M Cha - Optics Express, 2010 - opg.optica.org
We developed an accurate and efficient method for measuring the refractive indices of a
transparent plate by analyzing the transmitted intensity versus angle of incidence. By using …

Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser

S Maeng, J Park, BO, J Jin - Optics Express, 2012 - opg.optica.org
We have proposed a modified method to improve the measurement uncertainty of the
geometrical thickness and refractive index of a silicon wafer. Because measurement …

Refractive index variation in compression molding of precision glass optical components

L Su, Y Chen, AY Yi, F Klocke, G Pongs - Applied optics, 2008 - opg.optica.org
Compression molding of glass optical components is a high volume near net-shape
precision fabrication method. In a compression molding process, a variation of the refractive …

Thickness measurement of transparent plates by a self-mixing interferometer

MT Fathi, S Donati - Optics letters, 2010 - opg.optica.org
We introduce a technique to measure transparent glass slab thickness. It employs a very
simple setup combining two interferometers: a forward-going beam scheme and a self …

Simultaneous measurement of surface shape and optical thickness using wavelength tuning and a polynomial window function

Y Kim, K Hibino, N Sugita, M Mitsuishi - Optics express, 2015 - opg.optica.org
In this study, a 6N–5 phase shifting algorithm comprising a polynomial window function and
discrete Fourier transform is developed for the simultaneous measurement of the surface …

Vibration-insensitive measurements of the thickness profile of large glass panels

J Park, J Bae, J Jin, JA Kim, JW Kim - Optics Express, 2015 - opg.optica.org
We propose and realize a modified spectral-domain interferometer to measure the physical
thickness profile and group refractive index distribution of a large glass substrate …